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P30Z271X500GD

Description
Ceramic Capacitor, Ceramic, 50V, -82/+22ppm/Cel TC, 0.00027uF, 0303
CategoryPassive components    capacitor   
File Size179KB,3 Pages
ManufacturerCapax Technologies Inc
Websitehttp://www.capaxtechnologies.com/
Environmental Compliance
Download Datasheet Parametric View All

P30Z271X500GD Overview

Ceramic Capacitor, Ceramic, 50V, -82/+22ppm/Cel TC, 0.00027uF, 0303

P30Z271X500GD Parametric

Parameter NameAttribute value
Is it lead-free?Lead free
Is it Rohs certified?conform to
MakerCapax Technologies Inc
Reach Compliance Codecompliant
ECCN codeEAR99
capacitance0.00027 µF
Capacitor typeCERAMIC CAPACITOR
Custom functionsBulk Pack On Request
dielectric materialsCERAMIC
high0.127 mm
JESD-609 codee4
length0.762 mm
multi-layerNo
Number of terminals2
Maximum operating temperature85 °C
Minimum operating temperature-30 °C
Package formSMT
method of packingWaffle Pack
Rated (DC) voltage (URdc)50 V
size code0303
Temperature Coefficient-82/+22ppm/Cel ppm/°C
Terminal surfaceGold (Au) - with Nickel (Ni) barrier
width0.762 mm
Base Number Matches1
Technologies, Inc
Ceramic Single-Layer
Microwave Capacitors
Parallel Plate Ceramic Single Layer Microwave Capacitors (SLCs)
are ideally suited for applications such as GaAs integrated
circuits, microwave integrated circuits, DC block, bypass, and tuning,
and RF/microwave components. The SLC design offers
increased capacitance for additional bandwidth, increased stability in
capacitance over various temperatures, and more capacitance in
smaller case sizes for greater board density.
SLCs are suitable solutions for applications that require:
Through 40 GHz with minimum insertion loss.
Specified material from a selection of fourteen standard
dielectric options.
Imperviousness to electrostatic discharge and more ruggedness than MOS/MNS capacitors.
Gold plated electrode termination, which is compatible with solder, eutectic, epoxy and wire
bonding production methods.
General Specifications
M
ECHANICAL
H
IGH
R
ELIABILITY
T
ESTING
Bond Strength: Exceeds MIL-STD-883,
Method 2011 Destructive Bond Pull Test
Die Shear Strength: Exceeds applicable
MIL-STD-883 requirements.
Low Voltage Humidity: Paragraph 3.17, MIL-C-49464
Burn-in/Life Test: MIL-STD-202, Method 108, Condition A/F
Solderability: MIL-STD-202, Method 208
Group A: 100 Hour burn-in, 100% screening.
Group B: Group A tests, solderability, bond strength,
die shear strength, and temperature coefficient.
Group C: Group B tests, thermal shock, resistance to
soldering heat, low voltage humidity, and life test.
E
NVIRONMENTAL
S
TRIPLINE
T
HICKNESS
C
AP
L
W
C
ASE
D
IMENSIONS
in
Case Size
Width (W)
Length (L)
Thickness
(50V)
Thickness
(100V)
P10
.010
(.254)
.010
(.254)
.005
(.127)
.007
(.178)
Inches (mm)
P13
.013
(.330)
.013
(.330)
.005
(.127)
.007
(.178)
P15
.015
(.381)
.015
(.381)
.005
(.127)
.007
(.178)
P20
.020
(.508)
.020
(.508)
.005
(.127)
.007
(.178)
P25
.025
(.635)
.025
(.635)
.005
(.127)
.007
(.178)
P30
.030
(.762)
.030
(.762)
.005
(.127)
.007
(.178)
P35
.035
(.889)
.035
(.889)
.005
(.127)
.007
(.178)
P40
.040
(1.02)
.040
(1.02)
.005
(.127)
.007
(.178)
P50
.050
(1.27)
.050
(1.27)
.008
(.203)
P70
.070
(1.78)
.070
(1.78)
.008
(.203)
P90
.90
(2.29)
.100
(2.54)
.009
(.229)
PA0
.100
(2.54)
.100
(2.54)
.010
(.254)
** Tolerance: ±.002 (.050) or 10%
C
APAX
T
ECHNOLOGIES
, I
NC
º
24842 A
VE
T
IBBITTS
º
V
ALENCIA
, C
A
º
91355
º
661.257.7666
º
F
AX
: 661.257.4819
WWW
.C
APAX
T
ECHNOLOGIES
.C
OM
º
P
AGE
1
º

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