XE641S-A65G-0.450MHZ datasheet, PDF

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XE641S-A65G-0.450MHZ: DescriptionACMOS Output Clock Oscillator,; CategoryPassive components oscillator; File Size76KB，9 Pages; ManufacturerXsis Electronics Inc.; Environmental Compliance

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XE641S-A65G-0.450MHZ Overview

ACMOS Output Clock Oscillator,

XE641S-A65G-0.450MHZ Parametric

Parameter Name	Attribute value
Is it Rohs certified?	conform to
Objectid	1321708137
package instruction	SMDIP4,.31,200
Reach Compliance Code	compliant
Other features	ENABLE/DISABLE FUNCTION
maximum descent time	5 ns
Frequency Adjustment - Mechanical	NO
frequency stability	10%
Installation features	SURFACE MOUNT
Number of terminals	4
Nominal operating frequency	0.45 MHz
Maximum operating temperature	95 °C
Minimum operating temperature	-40 °C
Oscillator type	ACMOS
Output load	10 KOHM, 15 pF
Package body material	CERAMIC
Encapsulate equivalent code	SMDIP4,.31,200
physical size	8.89mm X 7.4mm X 4.19mm
longest rise time	5 ns
Maximum slew rate	5 mA
Maximum supply voltage	5.5 V
Minimum supply voltage	4.5 V
Nominal supply voltage	5 V
surface mount	YES
maximum symmetry	55/45 %
technology	CMOS

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REV LTR

DESCRIPTION

Updated per ECN 2012-10

Updated per ECN 2012-15

Updated per ECN 2013-21

Updated per ECN 2016-7

DATE

12/15/11

8/15/12

10/25/13

12/15/16

APPVD.

MLG

SPG

XSIS XE641S - A00, SERIES

HC/ACMOS OSCILLATORS

FOR SPACE APPLICATIONS

450 KHz to 90 MHz

( 7 x 9 mm, Formed-Leads, SMD, 5.0V)

(

Refer to Page 5 for Models with Reduced Screening & QCI )

REV STATUS

OF SHEETS

APPROVALS

PREP.

ENG.

Q. A.

S. Gupta

REV

SHEET NO.

DATE

9/10/10

9 10 11 12 13 14 15 16

XSIS ELECTRONICS, INC.

12620 W. 63

Street, Shawnee, KS 66216 USA

M. Gupta

XE641S - A00 SERIES HC/ACMOS

“S” LEVEL OSCILLATORS

FSC NO.

57051

SCALE

N/A

SHEET

DWG. NO.

CUST.

ENG.

CUST

Q A.

XE641S-A00

1 OF 3

3.7.3 Passive Elements: Established Reliability (ER) QPL components, failure level R minimum shall

be used or element lot evaluation shall be as per MIL-PRF-55310, class S, or MIL-PRF-38534,

Appendix C, Class K as applicable.

3.7.4 Microcircuit die shall be from lots that have passed the element evaluation per MIL-PRF-55310,

Appendix B, Level S, except testing per Subgroup 5 is omitted. Subgroup 5 testing is circuit

configuration dependent, therefore, it is more effectively performed at the oscillator level as

explained in Paragraph 3.7.5 herein.

3.7.5 Microcircuit die used in the oscillator shall be from NSC/FC 54ACT family and must be from

wafer lot that has been successfully tested in the oscillator for ionizing radiation of up to100 krads.

Xsis Electronics has also performed SET & SEL testing on the microcircuit die. Test reports are

available on request.

3.7.6 Workmanship, Rework and Process controls shall be in accordance with the requirements of

MIL-PRF-55310.

3.7.7 Lot Traceability: Production lot for these oscillators shall be homogenous. Each element used in

the production lot shall be traceable to a single lot. Swept quartz shall be traceable to the quartz

bar, and its applicable processing details.

Quality Assurance Provisions: The quality assurance provisions shall be per MIL-PRF-55310,

except as specified herein.

100% Screening: The 100% screening shall be performed as per Table II. PDA requirements for

nondestructive bond pull and burn-in shall be as specified below.

PDA for Nondestruct Bond Pull: Unless otherwise specified, PDA shall be 2% of total number of

wires or 1 wire whichever is greater.

PDA for Burn-in: Unless otherwise specified, PDA for burn-in shall be 2% or 1 oscillator whichever

is greater and shall be applicable to +23 C and/or +25 C static tests only. In addition Delta

Calculation shall be performed after Burn-in and shall count for PDA. All measured values for

Delta Calculation shall be recorded. Parts that exceed the specified delta limits shall be rejected and

be counted for PDA. Delta Calculation shall be performed at 5.0 VDC for the following parameters:

Input Current

Output High Level

Output Low Level

10% change Maximum

0.1V change Maximum

4.1

4.2

4.3

4.4

Group A inspection shall be in accordance with MIL-PRF-55310 for product level S.

4.5

Group B inspection ( 30 day aging ) shall be in accordance with MIL-PRF-55310 for product level S.

In order to expedite delivery, by customer request, the aging test can be ended after 15 days if the

amount of frequency aging is less than 50% of the 30 day specification limit.

4.6

Oscillators shall be capable of meeting group C inspection per MIL-PRF-55310. Generic group C

inspection data on similar parts may be used to satisfy this requirement. When specified by the

Customer, Xsis Electronics will perform Group C testing at an additional charge.

XSIS ELECTRONICS, INC.

12620 W. 63

FSC NO.

USA

DWG. NO.

REV

St., Shawnee, KS 66216

57051

SCALE

N/A

XE641S-A00

SHEET

3 OF 9

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