CD4510BMS, CD4516BMS
Data Sheet
December 1992
File Number 3338
CMOS Presettable Up/Down Counters
CD4510BMS Presettable BCD Up/Down Counter and the
CD4516BMS Presettable Binary Up/Down counter consist of
four synchronously clocked D-type flip-flops (with a gating
structure to provide T-type flip-flop capability) connected as
counters. These counters can be cleared by a high level on
the RESET line, and can be preset to any binary number
present on the jam inputs by a high level on the PRESET
ENABLE line. The CD4510BMS will count out of non-BCD
counter states in a maximum of two clock pulses in the up
mode, and a maximum of four clock pulses in the down mode.
If the CARRY IN input is held low, the counter advances up or
down on each positive-going clock transition. Synchronous
cascading is accomplished by connecting all clock inputs in
parallel and connecting the CARRY OUT of a less significant
stage to the CARRY IN of a more significant stage.
The CD4510BMS and CD4516BMS can be cascaded in the
ripple mode by connecting the CARRY OUT to the clock of
the next stage. If the UP/DOWN input changes during a ter-
minal count, the CARRY OUT must be gated with the clock,
and the UP/DOWN input must change while the clock is
high. This method provides a clean clock signal to the sub-
sequent counting stage. (See Figures 13, 14.)
These devices are similar to types MC14510 and MC14516.
The CD4510BMS and CD4516BMS are supplied in these
16-lead outline packages:
Braze Seal DIP
Frit Seal DIP
Ceramic Flatpack
*CD4510B Only
*H4W †H45
*FBF
†H1F
H6W
†CD4516B Only
Features
• High Voltage Types (20V Rating)
• CD4510BMS - BCD Type
• CD4516BMS - Binary Type
• Medium Speed Operation
- fCL = 8MHz Typ. at 10V
• Synchronous Internal Carry Propagation
• Reset and Preset Capability
• 100% Tested for Quiescent Current at 20V
• 5V, 10V and 15V Parametric Ratings
• Standardized Symmetrical Output Characteristics
• Maximum Input Current of 1µA at 18V Over Full Pack-
age Temperature Range; 100nA at 18V and +25
o
C
• Noise Margin (Over Full Package/Temperature Range)
- 1V at VDD = 5V
- 2V at VDD = 10V
- 2.5V at VDD = 15V
• Meets All Requirements of JEDEC Tentative Standard
No. 13B, “Standard Specifications for Description of
‘B’ Series CMOS Devices”
Applications
• Up/Down Difference Counting
• Multistage Synchronous Counting
• Multistage Ripple Counting
• Synchronous Frequency Dividers
Pinout
CD4510BMS, CD4516BMS
TOP VIEW
Functional Diagram
PRESET ENABLE
1
P1
P2
P3
P4
4
12
13
3
6
11
14
2
Q1
Q2
Q3
Q4
PRESET ENABLE
Q4
P4
P1
CARRY IN
Q1
CARRY OUT
VSS
1
2
3
4
5
6
7
8
16 VDD
15 CLOCK
14 Q3
13 P3
12 P2
11 Q2
CLOCK
10 UP/DOWN
9 RESET
UP/DOWN
CARRY IN
15
10
5
7
CARRY OUT
9
RESET
VDD = 16
VSS = 8
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
CD4510BMS, CD4516BMS
Absolute Maximum Ratings
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . . -0.5V to +20V
(Voltage Referenced to VSS Terminals)
Input Voltage Range, All Inputs . . . . . . . . . . . . . -0.5V to VDD +0.5V
DC Input Current, Any One Input.
. . . . . . . . . . . . . . . . . . . . . . . .±10mA
Operating Temperature Range . . . . . . . . . . . . . . . -55
o
C to +125
o
C
Package Types D, F, K, H
Storage Temperature Range (TSTG). . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265
o
C
At Distance 1/16
±
1/32 Inch (1.59mm
±
0.79mm) from case for
10s Maximum
Reliability Information
Thermal Resistance. . . . . . . . . . . . . . . .
θ
ja
θ
jc
Ceramic DIP and FRIT Package . . . .
80
o
C/W
20
o
C/W
Flatpack Package . . . . . . . . . . . . . . . .
70
o
C/W
20
o
C/W
o
C
Maximum Package Power Dissipation (PD) at +125
For TA = -55
o
C to +100
o
C (Package Type D, F, K) . . . . . .500mW
For TA = +100
o
C to +125
o
C (Package Type D, F, K) . . . . . Derate
Linearity at 12mW/
o
C to 200mW
Device Dissipation per Output Transistor. . . . . . . . . . . . . . . .100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+175
o
C
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP A
SUBGROUPS
1
2
VDD = 18V, VIN = VDD or GND
Input Leakage Current
IIL
VIN = VDD or GND
VDD = 20
3
1
2
VDD = 18V
Input Leakage Current
IIH
VIN = VDD or GND
VDD = 20
3
1
2
VDD = 18V
Output Voltage
Output Voltage
Output Current (Sink)
Output Current (Sink)
Output Current (Sink)
Output Current (Source)
Output Current (Source)
Output Current (Source)
Output Current (Source)
N Threshold Voltage
P Threshold Voltage
Functional
VOL15
VOH15
IOL5
IOL10
IOL15
IOH5A
IOH5B
IOH10
IOH15
VNTH
VPTH
F
VDD = 15V, No Load
VDD = 15V, No Load (Note 3)
VDD = 5V, VOUT = 0.4V
VDD = 10V, VOUT = 0.5V
VDD = 15V, VOUT = 1.5V
VDD = 5V, VOUT = 4.6V
VDD = 5V, VOUT = 2.5V
VDD = 10V, VOUT = 9.5V
VDD = 15V, VOUT = 13.5V
VDD = 10V, ISS = -10µA
VSS = 0V, IDD = 10µA
VDD = 2.8V, VIN = VDD or GND
VDD = 20V, VIN = VDD or GND
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Input Voltage Low
(Note 2)
Input Voltage High
(Note 2)
Input Voltage Low
(Note 2)
Input Voltage High
(Note 2)
VIL
VIH
VIL
VIH
VDD = 5V, VOH > 4.5V, VOL < 0.5V
VDD = 5V, VOH > 4.5V, VOL < 0.5V
VDD = 15V, VOH > 13.5V,
VOL < 1.5V
VDD = 15V, VOH > 13.5V,
VOL < 1.5V
3
1, 2, 3
1, 2, 3
1
1
1
1
1
1
1
1
1
7
7
8A
8B
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
LIMITS
TEMPERATURE
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
-
3.5
-
11
1.5
-
4
-
V
V
V
V
MIN
-
-
-
-100
-1000
-100
-
-
-
-
14.95
0.53
1.4
3.5
-
-
-
-
-2.8
0.7
MAX
10
1000
10
-
-
-
100
1000
100
50
-
-
-
-
-0.53
-1.8
-1.4
-3.5
-0.7
2.8
UNITS
µA
µA
µA
nA
nA
nA
nA
nA
nA
mV
V
mA
mA
mA
mA
mA
mA
mA
V
V
V
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
(NOTE 1)
VDD = 20V, VIN = VDD or GND
VOH > VOL <
VDD/2 VDD/2
NOTES: 1. All voltages referenced to device GND, 100% testing being im-
plemented.
2. Go/No Go test with limits applied to inputs.
3. For accuracy, voltage is measured differentially to VDD. Limit is
0.050V max.
2
CD4510BMS, CD4516BMS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP A
SUBGROUPS
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
VDD = 5V, VIN = VDD or GND
(Note 3)
VDD = 5V, VIN = VDD or GND
9
10, 11
9
10, 11
VDD = 5V, VIN = VDD or GND
9
10, 11
LIMITS
TEMPERATURE
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
MIN
-
-
-
-
-
-
-
-
-
-
-
-
2
1.48
MAX
400
540
420
567
480
648
250
338
640
864
200
270
-
-
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
PARAMETER
Propagation Delay
Clock to Q Output
Propagation Delay
Preset or Reset to Q
Propagation Delay
Clock to Carry Out
Propagation Delay
Carry In to Carry Out
Propagation Delay
Preset or Reset to Carry
Out
Transition Time
SYMBOL
TPHL1
TPLH1
TPHL2
TPLH2
TPHL3
TPLH3
TPHL4
TPLH4
TPHL5
TPLH5
TTHL
TTLH
FCL
CONDITIONS
(NOTE 1, 2)
VDD = 5V, VIN = VDD or GND
Maximum Clock Input Fre-
quency
NOTES:
1. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
2. -55
o
C and +125
o
C limits guaranteed, 100% testing being implemented.
3. Reset to Carry Out (TPLH) only.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
VDD = 5V, VIN = VDD or GND
NOTES
1, 2
TEMPERATURE
-55
o
C, +25
o
C
+125
o
C
VDD = 10V, VIN = VDD or GND
1, 2
-55
o
C, +25
o
C
+125
o
C
VDD = 15V, VIN = VDD or GND
1, 2
-55
o
C, +25
o
C
+125
o
C
Output Voltage
Output Voltage
Output Voltage
Output Voltage
Output Current (Sink)
VOL
VOL
VOH
VOH
IOL5
VDD = 5V, No Load
VDD = 10V, No Load
VDD = 5V, No Load
VDD = 10V, No Load
VDD = 5V, VOUT = 0.4V
1, 2
1, 2
1, 2
1, 2
1, 2
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
+125
o
C
-55
o
C
Output Current (Sink)
IOL10
VDD = 10V, VOUT = 0.5V
1, 2
+125
o
C
-55
o
C
Output Current (Sink)
IOL15
VDD = 15V, VOUT = 1.5V
1, 2
+125
o
C
-55
o
C
Output Current (Source)
IOH5A
VDD = 5V, VOUT = 4.6V
1, 2
+125
o
C
-55
o
C
MIN
-
-
-
-
-
-
-
-
4.95
9.95
0.36
0.64
0.9
1.6
2.4
4.2
-
-
MAX
5
150
10
300
10
600
50
50
-
-
-
-
-
-
-
-
-0.36
-0.64
UNITS
µA
µA
µA
µA
µA
µA
mV
mV
V
V
mA
mA
mA
mA
mA
mA
mA
mA
3
CD4510BMS, CD4516BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Output Current (Source)
SYMBOL
IOH5B
CONDITIONS
VDD = 5V, VOUT = 2.5V
NOTES
1, 2
TEMPERATURE
+125
o
C
-55
o
C
Output Current (Source)
IOH10
VDD = 10V, VOUT = 9.5V
1, 2
+125
o
C
-55
o
C
Output Current (Source)
IOH15
VDD =15V, VOUT = 13.5V
1, 2
+125
o
C
-55
o
C
Input Voltage Low
Input Voltage High
Propagation Delay
Clock to Q Output
Propagation Delay
Preset or Reset to Q
Propagation Delay
Clock to Carry Out
Propagation Delay
Carry In to Carry Out
Propagation Delay Preset
or Reset to Carry Out
Transition Time
VIL
VIH
TPHL1
TPLH1
TPHL2
TPLH2
TPHL3
TPLH3
TPHL4
TPLH4
TPHL5
TPLH5
TTLH
TTHL
FCL
VDD = 10V, VOH > 9V, VOL < 1V
VDD = 10V, VOH > 9V, VOL < 1V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
VDD = 10V
VDD = 15V
TH
VDD = 5V
VDD = 10V
VDD = 15V
Minimum Data Setup Time
Preset Enable to JN
TS
VDD = 5V
VDD = 10V
VDD = 15V
Minimum Data Hold Time
Clock to Carry In
TH
VDD = 5V
VDD = 10V
VDD = 15V
Minimum Clock Hold Time
Clock to Up/Down
TH
VDD = 5V
VDD = 10V
VDD = 15V
Input Capacitance
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized on initial
design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. Reset to Carry Out (TPLH) only.
CIN
Any Input
1, 2
1, 2
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3, 4
1, 2, 3, 4
1, 2, 3
1, 2, 3
1, 2
1, 2
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2
+25
o
C, +125
o
C, -
55
o
C
+25
o
C, +125
o
C, -
55
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
-
-
-
-
-
-
-
+7
-
-
-
-
-
-
-
-
-
-
-
-
4
5.5
-
-
-
-
-
-
-
-
-
-
-
-
-
MAX
-1.15
-2.0
-0.9
-1.6
-2.4
-4.2
3
-
200
150
210
160
240
180
120
100
320
250
100
80
-
-
70
40
40
25
10
10
60
30
30
30
30
30
7.5
UNITS
mA
mA
mA
mA
mA
mA
V
V
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
pF
Maximum Clock Input Fre-
quency
Minimum Hold Time
Preset Enable to JN
4
CD4510BMS, CD4516BMS
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
SYMBOL
IDD
VNTH
∆VTN
VTP
∆VTP
F
CONDITIONS
VDD = 20V, VIN = VDD or GND
VDD = 10V, ISS = -10µA
VDD = 10V, ISS = -10µA
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL
TPLH
VDD = 5V
1, 2, 3, 4
+25
o
C
NOTES
1, 4
1, 4
1, 4
1, 4
1, 4
1
TEMPERATURE
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
-
-2.8
-
0.2
-
VOH >
VDD/2
-
MAX
25
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25
o
C
Limit
UNITS
µA
V
V
V
V
V
ns
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
3. See Table 2 for +25
o
C limit.
4. Read and Record
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25
o
C
PARAMETER
Supply Current - MSI-2
Output Current (Sink)
Output Current (Source)
SYMBOL
IDD
IOL5
IOH5A
±
1.0µA
±
20% x Pre-Test Reading
±
20% x Pre-Test Reading
DELTA LIMIT
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
PDA (Note 1)
Interim Test 3 (Post Burn-In)
PDA (Note 1)
Final Test
Group A
Group B
Subgroup B-5
Subgroup B-6
Group D
MIL-STD-883
METHOD
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
Sample 5005
Sample 5005
Sample 5005
Sample 5005
GROUP A SUBGROUPS
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9, Deltas
1, 7, 9
1, 7, 9, Deltas
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 7, 9
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
Subgroups 1, 2, 3, 9, 10, 11
IDD, IOL5, IOH5A
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
5005
TEST
PRE-IRRAD
1, 7, 9
POST-IRRAD
Table 4
READ AND RECORD
PRE-IRRAD
1, 9
POST-IRRAD
Table 4
CONFORMANCE GROUPS
Group E Subgroup 2
5
RF/Wirelessly
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