QS225L2B-100.000MHZ datasheet, PDF

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QS225L2B-100.000MHZ: DescriptionLVCMOS Output Clock Oscillator,; CategoryPassive components oscillator; File Size2MB，32 Pages; ManufacturerQ-TECH Corporation

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QS225L2B-100.000MHZ Overview

LVCMOS Output Clock Oscillator,

QS225L2B-100.000MHZ Parametric

Parameter Name	Attribute value
Is it Rohs certified?	incompatible
Objectid	7062381004
package instruction	FLAT PACK, 20 PIN
Reach Compliance Code	compliant
Country Of Origin	USA
YTEOL	4.59
Frequency Adjustment - Mechanical	NO
frequency stability	65%
JESD-609 code	e0
Installation features	SURFACE MOUNT
Number of terminals	20
Nominal operating frequency	100 MHz
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Oscillator type	LVCMOS
physical size	15.88mm x 15.88mm x 3.81mm
Maximum supply voltage	3.63 V
Minimum supply voltage	2.97 V
Nominal supply voltage	3.3 V
surface mount	YES
Terminal surface	Tin/Lead (Sn60Pb40)

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CLASS B+ PRODUCTS

Q-TECH

CORPORATION

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

Features

• Made in the USA

• ECCN: EAR99

• DFARS 252-225-7014 Compliant

Electronic Component Exemption

• Broad frequency range from 15kHz to 350MHz

• Rugged 4-point mount (SMD ceramic) or 3 point mount

(others) shock resistant

• ACMOS, LVCMOS, TTL, LVDS, LVPECL

• Tristate Output option (-D) except for LVDS and LVPECL

standard

• Hermetically sealed package

• Fundamental and 3rd Overtone design

• Swept Quartz Crystal or Cultured Quartz Crystal

• Low phase noise and jitter

• Q-Tech does not use pure lead or pure tin in its products

• Custom screening and QCI available with MCM part number

• MIL-PRF-55310/9, /16, /21, /26, /27, /28, /30, /33, /34, /35,

/37, /38, /39 equivalent

Ordering Information

Package:

See Pages 5, 25, 26, 27

Materials Level

1 = Rad Tolerant Die, Swept Quartz Crystal

2 = Rad Tolerant Die, Cultured Quartz Crystal

3 = Class B Die, Swept Quartz Crystal

Lead Finish:

T = Standard

(*)

S = Solder Dip

(**)

Q T18 8A C D 10S -10 0.0 0 0 M H z

Q T 1 88 AC D 10 S - 100.000MHz

Output Frequency

(Sample part number)

Logic & Supply Voltage:

ACMOS (****)

HCMOS

LVCMOS

TTL

LVCMOS

LVDS

LVPCL

LVPECL

(All B+ Packages)

(QT122, QT128, QT125, QT127, QT193 & QT194 Only)

5.0V

3.3V

5.0V

2.5V

3.3V

2.5V

3.3V

2.5V

(Standard offering in LW & NW)

Blank = No Tristate

D = Tristate

Tristate Option:

19 =

(*)

(**)

(***)

(****)

Frequency vs. Temperature Code (***):

± 65ppm at -55ºC to +125ºC

± 50ppm at -55ºC to +105ºC

± 75ppm at -55ºC to +125ºC

± 50ppm at -55ºC to +125ºC

±100ppm at -55ºC to +125ºC

± 50ppm at -40ºC to +85ºC

±100ppm at -40ºC to +85ºC

± 15ppm at 23ºC ± 1ºC

± 50ppm at -55ºC to +125ºC reference to F at 23ºC

Screening Option:

Per MIL-PRF-38534, Class K (modified)

Per MIL-PRF-55310, Level S

Per MIL-PRF-55310, Level S (modified)

Per MIL-PRF-55310, Level B (modified)

Per NASA EEE-INST-002, Level 1

Engineering Model

QPDS-0001, Rev N, June 2015 (ECO 11510)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com

For Non-Standard requirements, contact Q-Tech Corporation at Sales@Q-Tech.com

Gold Plated: 50μ ~ 80μ inches typ.

Hot Solder Dip Sn60/Pb40 per MIL-PRF 55310 is optional for an additional cost

Frequency stability vs. temperature codes may not be available in all frequencies

HCMOS & TTL compatible

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CLASS B+ PRODUCTS

Q-TECH

CORPORATION

GENERAL SPECIFICATION

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

1.1

1.2

2.1

SCOPE

Scope. This specification establishes the general quality and reliability requirements for a family of hybrid, hermetically sealed

square wave, B+ crystal oscillators.

Part Number. The part number shall be as specified in the detail specification.

APPLICABLE DOCUMENTS

Specifications and Standards. Unless otherwise specified, the following documents shall be applicable to this specification to

the extent specified herein.

SPECIFICATIONS

MIL-PRF-55310 Crystal Oscillators, General Specification For

STANDARDS

MIL-STD-202

MIL-PRF-38534 Hybrid Microcircuits, General Specification For

NASA EEE-INST-002 Instructions for EEE Parts Sections, Screenings, Qualifications and Ratings

MIL-STD-883

Test Methods for Electronic and Electrical Component Parts

Test Methods and Procedures for Microelectronics

2.2

Conflicting Requirements. In the event of conflict between requirements of this specification and other requirements of the

applicable detail drawing, the precedence in which requirements shall govern, in descending order, is as follows:

a) Applicable Customer purchase order.

b) Applicable Customer detail drawing.

c) This specification.

2.3

d) Other specifications or standards referenced in 2.1 herein.

Customer Purchase Order Special Requirements. Additional special requirements shall be specified in the applicable Customer

purchase order when additional requirements or modifications specified herein are needed for compliance to special program

or product line requirements

Case Outline. The case outline shall be as specified in the detail specification. (See pages 25 to 27)

Lead Material and Finish. Lead material and finish shall be as shown on page 29.

Terminal Connections. The terminal connections shall be as shown on page 25.

Item Requirements. The individual item requirements shall be as specified herein and the detail specification.

REQUIREMENTS

3.2

3.1

3.2.1

3.2.3

3.2.2

3.2.4

3.4

3.3

Hot Solder Dip. Terminals can be solder dipped Sn60/Pb40 per MIL-PRF-55310 at additional cost. Prefix designated with an

“S”. See sample part number in the “Ordering Information” table.

Solderability. Leads shall meet the requirements of MIL-PRF-55310/38534 when tested.

Maximum Ratings. Unless otherwise specified, the maximum ratings shall as specified in the detail specification.

3.5

Electrical Performance Requirements. The electrical performance requirements shall be as specified herein and the applicable

detail specification.

Design and Construction. The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the

oscillators shall meet the design and construction requirements of MIL-PRF-55310.

QPDS-0001, Rev N, June 2015 (ECO 11510)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com

2 of 32

CLASS B+ PRODUCTS

Q-TECH

CORPORATION

GENERAL SPECIFICATION (Cont’d)

HIGH RELIABILITY HYBRID CRYSTAL CLOCK OSCILLATORS

2.5 to 5.0Vdc - 15kHz to 350MHz

3.5.2

3.5.1

3.5.3

Workmanship. The device workmanship shall meet the requirements of MIL-PRF-55310.

Construction Technology. The device shall be constructed as a class 2-Type 1 hybrid oscillator of MIL-PRF-55310.

Element Derating. All active and passive elements shall be derated in accordance with the applicable hybrid microcircuit

element requirements of MIL-STD-975. Elements shall not operate in excess of derated values.

3.5.4

3.5.5

3.5.6

3.5.7

3.5.8

3.5.9

Active Elements. The active component shall be derived from lots that meet the Element Evaluation requirements of

MIL-PRF-38534, Class K (for QT100 and QT200), and MIL-PRF-55310, Level B (QT300).

Passive Elements. Element Evaluation shall be as a minimum in accordance with MIL-PRF-55310, Level S for QT100 and

Level B for QT200 And QT300.

Quartz Crystal. Unless otherwise specified by the detail specification, the quartz crystal material for the QT100 and QT300

shall be swept synthetic, grade 2.2 or better and cultured quartz crystal for QT200.

Maximum Allowable Leak Rate. The maximum allowable leakage rate shall be as specified by MIL-STD-883, method 1014

based on the internal cavity volume. The hermetic seal (fine and gross leak) tests shall be in accordance with MIL-STD-883,

Method 1014.

Weight. The maximum weight of the crystal oscillator shall be defined on page 29.

Crystal Mounting. The crystal element shall be three-point minimum mounted in such a manner as to assure adequate crystal

performance when the oscillator is subjected to the environmental conditions specified herein.

3.5.10

3.5.11

3.5.12

4.1

4.2

4.2.2

4.3

4.2.1

Delta Criteria. The crystal oscillator shall meet the parameter delta criteria post burn-in called out in the detail specification.

The change in the parameter (delta) shall be calculated between the initial measurement and the present (interim or final)

measurement.

Marking. Each unit shall be permanently marked with the manufacturer's name or symbol, part number, frequency, lot date

code number, and serial number. The unit shall be marked with the outline of an equilateral triangle near pin 1 to show that it

contains devices which are sensitive to electrostatic discharge.

Traceability. Material, element and process traceability requirements shall be as specified by MIL-PRF-55310.

QUALITY ASSURANCE PROVISIONS

Rework Provisions. Rework shall be in accordance with the provisions of MIL-PRF-55310.

3.5.13

Responsibility for Inspection. Unless otherwise specified in the contract or purchase order, the supplier shall be responsible for

the performance of all inspection requirements as specified. Customer reserves the right to perform any of the inspections set

forth in the specification where such inspections are deemed necessary to assure supplies and services conform to prescribed

requirements, and to return any product failing to meet the specified requirements.

Screening. Hybrid crystal oscillators shall have been subjected to and successfully passed all the screening tests as applicable

in Tables I, II, III, IV, V, VI.

Percent Defective Allowable (PDA). The percent defective allowable shall be 2% (Screening Option S, A, C) or 5% (Screening

Option N) 10% (Screening Option B) or one device, whichever is greater. PDA accountability shall be based on failures occurring

during the second half of burn-in only. PDA shall be applicable to the +25 ºC static parameters as specified in the delta criteria.

Nondestructive Bondpull. 100% Non-destructive bondpull applicable to screening S, A, C, N.

Quality Conformance Inspection (QCI). Shall be as outlined in the QCI section for each screening option here-in. All records

shall be traceable to the lot number and unit serial number. Samples used for Group A that pass all tests may be delivered on

contract prior to QCI completion.

QPDS-0001, Rev N, June 2015 (ECO 11510)

Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com

3 of 32

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