INCH-POUND
MIL-PRF-55514F
15 December 2005
SUPERSEDING
MIL-PRF-55514E
2 April 2002
PERFORMANCE SPECIFICATION
CAPACITORS, FIXED, PLASTIC (OR METALLIZED PLASTIC)
DIELECTRIC, DC OR DC-AC, IN NONMETAL CASES,
NON-ESTABLISHED AND ESTABLISHED RELIABILITY
GENERAL SPECIFICATION FOR
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
SCOPE
1.1 Scope. This specification covers the general requirements for established reliability (ER) and non-established
reliability (non-ER), (product level C), plastic (or metallized plastic) dielectric, fixed capacitors, enclosed in nonmetal
cases intended primarily, in view of the limited long term moisture resistant characteristics, for use in potted or
encapsulated systems, in blocking, filter, and by-pass applications (see
6.4).
ER capacitors covered by this
specification have failure rate levels (M, P, R, and S) ranging from 1.0 percent to 0.001 percent per 1,000 hours.
These failure rates (FR) are established at a 90-percent confidence level and maintained at a 10-percent producer’s
risk and based on life tests performed at +85°C or +105°C, whichever is applicable. An acceleration factor of 5:1
has been used to relate life test data obtained at 125 percent, or 140 percent of rated voltage at +85°C or +105°C,
whichever is applicable, to rated voltage at +85°C or +105°C, whichever is applicable. The product levels are based
on catastrophic failures and failures occurring outside the degradation limits.
1.2 Classification. Capacitors covered by this specification are classified by style (see 1.2.1.1 and
3.1).
1.2.1 Part or Identifying Number (PIN). The term Part or Identifying Number (PIN) is equivalent to the term (part
number, identification number, and type designator) that was previously used in this specification. The PIN is in the
following form and as specified (see 3.1).
CFR02
A
M
C
682
J
M
Style
(1.2.1.1)
Terminal
Symbol
(1.2.1.2)
Characteristic
(1.2.1.3)
Rated
voltage
(1.2.1.4)
Capacitance
(1.2.1.5)
Capacitance
tolerance
(1.2.1.6)
Product
level
designator
(1.2.1.7)
1.2.1.1 Style. The style is identified by the three-letter symbol "CFR" followed by a two-digit number; the letters
identify ER and non-ER, plastic dielectric fixed capacitors in nonmetal cases.
*
Comments, suggestions, or questions on this document should be addressed to: US Army Communications-
Electronics Command and Fort Monmouth, ATTN: AMSEL-LC-LEO-E-EP, Fort Monmouth, NJ 07703-5023, or e-
mailed to
jeffrey.carver@mail1.monmouth.army.mil.
Since contact information can change, you may want to
verify the currency of this address information using the ASSIST Online database at
http://assist.daps.dla.mil.
AMSC N/A
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5910
MIL-PRF-55514F
1.2.1.2 Terminal symbol. The terminal is identified by a single letter as shown in table I.
TABLE I. Terminal symbol.
Symbol
A
R
L
Terminal
Axial wire-lead
Radial wire-lead
Lugs
1.2.1.3 Characteristic. The characteristic is identified by a single letter as shown in table II.
TABLE II. Characteristic.
Characteristic
K
L
M
N
Q
R
U
V
Dielectric material
Polypropylene
Polypropylene
Polyethylene terephthalate
Polyethylene terephthalate
Polycarbonate
Polycarbonate
Polyphenylene sulfide
Polyphenylene sulfide
Construction
Electrode
Foil
Metallized polypropylene
Foil
Metallized polyethylene terephthalate
Foil
Metallized polycarbonate
Metallized polyphenylene sulfide
Foil
-55°C to +105°C
-55°C to +105°C
-55°C to + 85°C
-55°C to + 85°C
-55°C to +125°C 1/
-55°C to +125°C 1/
-55°C to +125°C 1/
-55°C to +125°C 1/
Operating temperature range
1/ For operation at +125°C, characteristics Q, R, U and V capacitors are voltage derated (see table III).
1.2.1.4 Rated voltage. The rated voltage is identified by a single symbol as shown in table III.
TABLE III. Voltage rating.
Symbol
DC voltage rating
at +85°C 1/
Characteristics
Q and V
DC voltage rating
at +125°C
33.3
66.7
133.3
200.0
266.7
400.0
50.0
100.0
16.7
166.7
533.3
Characteristics
R and U
DC voltage rating
at +125°C
25
50
100
150
200
300
37.5
75
12.5
125
400
A
B
C
D
E
F
G
H
J
K
L
50
100
200
300
400
600
75
150
25
250
800
1/ DC voltage rating for characteristics K and L at +105°C are the same as those at +85°C.
1.2.1.5 Capacitance. The nominal capacitance value, expressed in picofarads (pF), is identified by a three-digit
number; the first two digits represent significant figures and the last digit specifies the number of zeros to follow.
NOTE: Tabulated capacitance values expressed in microfarads (µF) are given for information only (see
3.1).
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MIL-PRF-55514F
1.2.1.6 Capacitance tolerance. The capacitance tolerance is identified by a single letter as shown in table IV.
TABLE IV. Capacitance tolerance.
Symbol
F
G
J
K
M
Capacitance tolerance
percent (±)
1
2
5
10
20
1.2.1.7 Product level designator. The product level designator is identified by a single letter as shown in table V.
TABLE V. Failure rate level (FRL) (established at a 90-percent confidence level).
Symbol
C
M
P
R
S
1/ FRL (percent per 1,000 hours).
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this
specification, whether or not they are listed.
2.2 Government documents.
*
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
(See
supplement 1
for list of associated specification sheets.)
DEPARTMENT OF DEFENSE STANDARDS
- Test Methods Standard Electronics and Electrical Component Parts.
- Failure Rate Sampling Plans and Procedures.
- Standard Practice for Established Reliability and High Reliability Qualified Products List
(QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications.
MIL-STD-810
- Environmental Engineering Consideration and Laboratory Tests.
MIL-STD-1276
- Leads for Electronic Component Parts.
MIL-STD-1285
- Marking of Electrical and Electronic Parts.
*
(Copies of these documents are available online at
http://assist.daps.dla.mil/quicksearch/
or from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
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MIL-STD-202
MIL-STD-690
MIL-STD-790
FRL
non-ER
1.0
1/
0.1
1/
0.01 1/
0.001 1/
MIL-PRF-55514F
*
*
2.3 Non-Government publications. The following documents form a part of this document to the extent specified
herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
ELECTRONIC INDUSTRIES ALLIANCE (EIA)
EIA-554-1
EIA-557
*
- Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM). (DoD adopted).
- Statistical Process Control Systems. (DoD adopted).
(Copies of these documents are available from
http://global.ihs.com/
or Global Engineering Documents, Attn:
Customer Service Department, 15 Inverness Way East, Englewood CO 80112-5776.)
2.4 Order of precedence. In the event of a conflict between the text of this document and the references cited
herein (except for related specification sheets), the text of this document takes precedence. Nothing in this
document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Specification sheets. The individual item requirements shall be as specified herein and in accordance with the
applicable specification sheet. In the event of any conflict between the requirements of this specification and the
specification sheet, the latter shall govern.
3.2 Qualification. Capacitors furnished under this specification shall be products which are authorized by the
qualifying activity for listing on the applicable qualified products list (QPL) at the time set for opening of bids (see
4.4
and
6.3).
In addition, the manufacturer shall obtain certification from the qualifying activity that the reliability
assurance requirements of
4.1
have been met and are being maintained. Authorized distributors which are
approved to
MIL-STD-790
distributor requirements by the QPL manufacturers are listed in the QPL.
3.3 QPL system. The manufacturer shall establish and maintain a QPL system for parts covered by this
specification. Requirements for this system are specified in
MIL-STD-790
and
MIL-STD-690
(ER only). In addition
the manufacturer shall also establish a SPC and PPM system that meets the requirements as detailed in 3.3.1 and
3.3.2 respectively. The following
MIL-STD-790
exceptions are allowed:
a.
Under "Description of production processes and controls", the procedure for identification of each
production lot shall include only "the manufacturer shall as a minimum be able to identify the time period
during which the final production operation was performed on each item of product prior to final test. The
date or lot code marked on each part shall be identified to a production lot."
"Traceability" of materials shall not apply.
b.
3.3.1 SPC system. As part of the overall
MIL-STD-790
QPL system, the manufacturer shall establish an SPC
system that meets the requirements of
EIA-557.
3.3.2 PPM system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a ppm
system of assessing the average outgoing quality of lots in accordance with
EIA-554-1.
Data exclusion, in
accordance with
EIA-554-1
may be used with approval of the qualifying activity. The ppm system shall identify the
ppm rate at the end of each month and shall be based on a 6-month moving average. Style reporting may include
both ER and non-ER style combinations
.
3.4 Materials. Materials shall be as specified herein. However, when a definite material is not specified, a
material shall be used which will enable the capacitors to meet the performance requirements of this specification.
Acceptance or approval of any constituent material shall not be construed as a guaranty of the acceptance of the
finished product.
3.4.1 Insulating and sealing materials. Compounds and films used in the insulating and sealing of capacitors
shall be chemically inactive with respect to the capacitor element. The material, either in state of original application
or as a result of having aged, shall have no adverse effect on the performance of the capacitors.
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MIL-PRF-55514F
*
3.4.2 Pure tin. The use of pure tin, as an underplate or final finish, is prohibited both internally and externally. Tin
content of capacitor components and solder shall not exceed 97 percent. Tin shall be alloyed with a minimum of 3
percent lead (see
6.8).
3.5 Interface and physical dimensions requirements. Capacitors shall meet the interface requirements and
physical dimensions specified (see
3.1).
3.5.1 Case. Each capacitor shall be enclosed in a nonmetal case which will protect the capacitor element from
moisture, impregnant leakage, and mechanical damage under the test conditions specified herein. Cardboard shall
not be used for insulating purposes.
3.5.2 Terminals. Terminals shall be of a solid conductor, of the length and diameter specified (see
3.1),
and shall
be suitably treated to facilitate soldering. When a coating containing tin is used, the tin content shall range between
40 percent and 70 percent.
3.5.2.1 Solder dip (retinning) leads. Only the manufacturer (or his authorized category B or category C distributor)
may solder dip/retin the leads of product supplied to this specification provided the solder dip process has been
approved by the qualifying activity.
3.5.2.2 Qualifying activity approval. Approval of the solder dip process will be based on one of the following
options:
a.
When the original lead finish qualified was hot solder dip lead finish 52 of
MIL-STD-1276
(NOTE: The 200
microinch maximum thickness is not applicable.), the manufacturer shall use the same solder dip process
for retinning as is used in the original manufacture of the product.
When the lead originally qualified was not hot solder dip lead finish 52 of
MIL-STD-1276,
as prescribed in
3.5.2.2a, approval for the process to be used for solder dip shall be based on the following test procedure:
(1)
Thirty samples of any capacitance value for each style and lead finish are subjected to the
manufacturer's solder dip process. Following the solder dip process, the capacitors are subject to
the capacitance, dissipation factor, insulation resistance, dielectric withstanding voltage, and
equivalent series resistance measurements (as applicable). No defects are allowed.
Ten of the 30 samples are then subjected to the solderability test. No defects are allowed.
The remaining 20 samples are subjected to the resistance to solder heat test. No defects are
allowed. (NOTE: Solder dip of gold plated leads is not allowed.)
b.
(2)
(3)
3.5.2.3 Solder dip/retinning options. The manufacturer (or authorized category C distributor) may solder dip/retin
as follows:
a. As a corrective action if the lot fails the group A solderability test.
b.
After the group A inspection has been completed, following the solder dip/retinning process, the
capacitnace, dissipation factor, insulation resistance, dielectric withstanding voltage, and equivalent series
resistance measurements (as applicable) shall be performed on 100 percent of the lot. The percent
defective allowable (PDA) for the electrical measurements shall be as for the subgroup 1 tests. Following
these tests, the manufacturer shall submit the lot to the group A solderability test as specified in
4.8.16.
3.6 Resistance to solvents. When capacitors are tested as specified in
4.8.2,
markings shall remain legible and
shall not smear.
3.7 Preconditioning. When tested as specified in
4.8.3,
capacitors shall withstand the test conditions specified
without evidence of unwrapping of the capacitor case or sleeve or other damage to the case.
3.8 Burn-in (when specified,
see 3.1).
When tested as specified in
4.8.4,
capacitors shall withstand the exposure
to high temperature and overvoltages without visible damage.
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