Data Sheet
300mA HIGH SPEED, EXTREMELY LOW NOISE CMOS LDO REGULATOR
AP2125
General Description
The AP2125 series are 300mA, positive voltage regu-
lator ICs fabricated by CMOS process.
Each of these ICs is equipped with a voltage reference,
an error amplifier, a resistor network for setting output
voltage, a chip enable circuit, a current limit circuit and
OTSD (over temperature shut down) circuit to prevent
the IC from over current and over temperature.
The AP2125 series have features of high ripple rejec-
tion, low dropout voltage, low noise, high output volt-
age accuracy and low current consumption which
make them ideal for use in various battery-powered
apparatus.
The AP2125 have 1.8V, 2.5V, 2.8V, 3.0V, 3.3V, 4.15V
and 4.2V fixed voltage versions.
These ICs are available in tiny SC-70-5 and SC-82
packages as well as industry standard SOT-23-3 and
SOT-23-5 packages.
Features
·
·
·
·
·
·
·
·
·
Excellent Ripple Rejection: 70dB Typical (1.8V
Version)
Low Dropout Voltage: 65mV (I
OUT
=100mA,
3.3V Version)
Low Standby Current: 0.01µA Typical
Low Quiescent Current: 60µA Typical
Extremely Low Noise: 50µVrms Typical
Maximum Output Current: 300mA (Min.)
High Output Voltage Accuracy:
±
2%
Compatible with Low ESR Ceramic Capacitor
Excellent Line/Load Regulation
Applications
·
·
·
·
·
·
CDMA/GSM Cellular Handsets
Battery-powered Equipments
Laptops, Palmtops, Notebook Computers
Hand-held Instruments
PCMCIA Cards
Portable Information Appliances
SOT-23-3
SOT-23-5
SC-70-5
SC-82
Figure 1. Package Types of AP2125
May. 2010 Rev. 1. 4
1
BCD Semiconductor Manufacturing Limited
Data Sheet
300mA HIGH SPEED, EXTREMELY LOW NOISE CMOS LDO REGULATOR
AP2125
Absolute Maximum Ratings (Note 1)
Parameter
Input Voltage
Enable Input Voltage
Output Current
Junction Temperature
Storage Temperature Range
Lead Temperature (Soldering, 10sec)
Symbol
V
IN
V
CE
I
OUT
T
J
T
STG
T
LEAD
SOT-23-3
θ
JA
SOT-23-5
SC-70-5
SC-82
ESD (Human Body Model)
ESD (Machine Model)
ESD
ESD
6000
400
Value
6.5
-0.3 to V
IN
+0.3
450
150
-65 to 150
260
200
200
300
300
V
V
o
C/W
Unit
V
V
mA
o
C
o
C
o
C
Thermal Resistance
Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated
under "Recommended Operating Conditions" is not implied. Exposure to "Absolute Maximum Ratings" for extended periods
may affect device reliability.
Recommended Operating Conditions
Parameter
Input Voltage
Operating Ambient Temperature Range
Symbol
V
IN
T
A
Min
V
OUT
+0.5V
-40
Max
6
85
Unit
V
o
C
May. 2010 Rev. 1. 4
5
BCD Semiconductor Manufacturing Limited