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IRGCH50FE

Description
Insulated Gate Bipolar Transistor, 1200V V(BR)CES, N-Channel, DIE-2
CategoryDiscrete semiconductor    The transistor   
File Size18KB,1 Pages
ManufacturerInternational Rectifier ( Infineon )
Websitehttp://www.irf.com/
Download Datasheet Parametric View All

IRGCH50FE Overview

Insulated Gate Bipolar Transistor, 1200V V(BR)CES, N-Channel, DIE-2

IRGCH50FE Parametric

Parameter NameAttribute value
Is it Rohs certified?incompatible
MakerInternational Rectifier ( Infineon )
Parts packaging codeDIE
package instructionUNCASED CHIP, R-XUUC-N2
Contacts2
Reach Compliance Codecompliant
ECCN codeEAR99
Other featuresFAST SPEED
Collector-emitter maximum voltage1200 V
ConfigurationSINGLE
Gate emitter threshold voltage maximum5.5 V
JESD-30 codeR-XUUC-N2
JESD-609 codee0
Number of components1
Number of terminals2
Package body materialUNSPECIFIED
Package shapeRECTANGULAR
Package formUNCASED CHIP
Peak Reflow Temperature (Celsius)NOT SPECIFIED
Polarity/channel typeN-CHANNEL
Certification statusNot Qualified
surface mountYES
Terminal surfaceTIN LEAD
Terminal formNO LEAD
Terminal locationUPPER
Maximum time at peak reflow temperatureNOT SPECIFIED
Transistor component materialsSILICON
PD-9.1421
TARGET
IRGCH50FE
IRGCH50FE IGBT Die in Wafer Form
C
G
E
1200 V
Size 5
Fast Speed
5" Wafer
Electrical Characteristics ( Wafer Form )
Parameter
V
CE (on)
V
(BR)CES
V
GE(th)
I
CES
I
GES
Description
Collector-to-Emitter Saturation Voltage
Colletor-to-Emitter Breakdown Voltage
Gate Threshold Voltage
Zero Gate Voltage Collector Current
Gate-to-Emitter Leakage Current
Guaranteed (Min/Max)
Test Conditions
3.5V Max.
I
C
= 20A, T
J
= 25°C, V
GE
= 15V
1200V Min.
T
J
= 25°C, I
CES
= 250µA, V
GE
= 0V
3.0V Min., 5.5V Max.
V
GE
= V
CE
, T
J
=25°C, I
C
=250µA
250 µA Max.
T
J
= 25°C, V
CE
= 1200V
±
500 nA Max.
T
J
= 25°C, V
GE
= +/- 20V
Mechanical Data
Norminal Backmetal Composition, Thickness:
Norminal Front Metal Composition, Thickness:
Dimensions:
Wafer Diameter:
Wafer thickness:
Relevant Die Mechanical Dwg. Number
Minimum Street Width
Reject Ink Dot Size
Ink Dot Location
Recommended Storage Environment:
Reference Standard IR packaged part ( for design ) : IRGPH50F
Cr-Ni-Ag ( 1kA-4kA-6kA )
99% Al, 1% Si (3 microns)
0.257" x 0.260"
125mm, with std. < 100 > flat
.015" + / -.003"
01-5104
100 Microns
0.25mm Diameter Minimum
See Die Outline drawing below
Store in original container, in dessicated
nitrogen, with no contamination
Die Outline
INK DOT
LOCATION
3.01
(.119 )
NOTES :
1. ALL DIMENSIONS ARE SHOW N IN MILLIMETERS ( INCHES )
2. CONTRO LLING DIMENSION : ( INCH )
3. LETTER DESIGNATION :
S = SO URCE
G = GATE
4. DIMENSIONAL TOLERANCES
BONDING PADS : < 0.635 TO LERANCE = +/- 0.013
W IDTH
< (.0250 ) TOLERANCE =+/- (.0005 )
&
> 0.635 TOLERANCE = +/- 0.025
LENGTH
> (.0250 ) TOLERANCE = +/- (.0010 )
OVERALL DIE
< 1.270 TOLERANCE = +/- 0.102
W IDTH
< (.050 ) TOLERANCE = +/- (.004 )
&
> 0.635 TOLERANCE = +/- 0.203
LENGTH
> (.050 ) TOLERANCE = +/- (.008 )
5. UNLESS OTHERWISE NOTED ALL DIE ARE GEN III
1.78
(.070 )
EMITTER
6.60
(.260 )
0.56
(.022 )
G
6.53
(.257 )
0.58
(.023 )
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