White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
2
WF2M32-XXX5
ABSOLUTE MAXIMUM RATINGS
Parameter
Voltage on Any Pin Relative to V
SS
Power Dissipation
Storage Temperature
Short Circuit Output Current
Endurance - Write/Erase Cycles
(Mil Temp)
Data Retention (Mil Temp)
Symbol
V
T
P
T
Tstg
I
OS
Ratings
-2.0 to +7.0
8
-65 to +125
100
100,000 min
20
Unit
V
W
°C
mA
cycles
years
Parameter
OE capacitance
WE
1-4
capacitance
HIP (PGA)
HIP (Alternate pinout)
CQFP G4T
CQFP G2U
G2 (Alternate pinout)
CS
1-4
capacitance
Symbol
C
OE
C
WE
Conditions
V
IN
= 0 V, f = 1.0 MHz
V
IN
= 0 V, f = 1.0 MHz
20
50
50
20
50
C
CS
C
I/O
C
AD
V
IN
= 0 V, f = 1.0 MHz
V
I/O
= 0 V, f = 1.0 MHz
V
IN
= 0 V, f = 1.0 MHz
20
20
50
pF
pF
pF
Max Unit
50
pF
pF
CAPACITANCE
(T
A
= +25°C)
RECOMMENDED DC OPERATING CONDITIONS
Parameter
Supply Voltage
Ground
Input High Voltage
Input Low Voltage
Operating Temperature (Mil.)
Operating Temperature (Ind.)
Symbol
V
CC
V
SS
V
IH
V
IL
T
A
T
A
Min
4.5
0
2.0
-0.5
-55
-40
Typ
5.0
0
-
-
-
-
Max
5.5
0
V
CC
+ 0.5
+0.8
+125
+85
Unit
V
V
V
V
°C
°C
Data I/O capacitance
Address input capacitance
This parameter is guaranteed by design but not tested.
DC CHARACTERISTICS - CMOS COMPATIBLE
(V
CC
= 5.0V, V
SS
= 0V, T
A
= -55°C to +125°C)
Parameter
Input Leakage Current
Output Leakage Current
V
CC
Active Current for Read (1)
V
CC
Active Current for Program or Erase (2)
V
CC
Standby Current
Output Low Voltage
Output High Voltage
Low V
CC
Lock-Out Voltage
Symbol
I
LI
I
LOx32
I
CC1
I
CC2
I
CC3
V
OL
V
OH
V
LKO
Conditions
V
CC
= 5.5, V
IN
= GND to V
CC
V
CC
= 5.5, V
IN
= GND to V
CC
CS = V
IL
, OE = V
IH
, f = 5MHz
CS = V
IL
, OE = V
IH
V
CC
= 5.5, CS = V
IH
, f = 5MHz, RESET = Vcc
±
0.3V
I
OL
= 12.0 mA, V
CC
= 4.5
I
OH
= -2.5 mA, V
CC
= 4.5
0.85xVcc
3.2
4.2
Min
Max
10
10
160
240
8.0
0.45
Unit
µA
µA
mA
mA
mA
V
V
V
NOTES:
1. The Icc current listed includes both the DC operating current and the frequency dependent component (@ 5MHz). The frequency component typically is less than
2mA/MHz, with OE at V
IH
.
2. Icc active while Embedded Algorithm (program or erase) is in progress.
3. DC test conditions V
IL
= 0.3V, V
IH
= V
CC
- 0.3V
3
White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
WF2M32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS - WE CONTROLLED
(V
CC
= 5.0V, T
A
= -55°C to +125°C)
Parameter
Write Cycle Time
Chip Select Setup Time
Write Enable Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
Write Enable Pulse Width High
Duration of Byte Programming Operation (1)
Sector Erase (2)
Read Recovery Time before Write
V
CC
Setup Time
Chip Programming Time
Chip Erase Time (3)
Output Enable Hold Time (4)
RESET Pulse Width (5)
t
OEH
t
RP
10
500
t
AVAV
t
ELWL
t
WLWH
t
AVWL
t
DVWH
t
WHDX
t
WLAX
t
WHWL
t
WHWH1
t
WHWH2
t
GHWL
t
VCS
0
50
44
256
10
500
Symbol
Min
t
WC
t
CS
t
WP
t
AS
t
DS
t
DH
t
AH
t
WPH
90
0
45
0
45
0
45
20
300
15
0
50
44
256
10
500
-90
Max
Min
120
0
50
0
50
0
50
20
300
15
0
50
44
256
-120
Max
Min
150
0
50
0
50
0
50
20
300
15
-150
Max
ns
ns
ns
ns
ns
ns
ns
ns
µs
sec
µs
µs
sec
sec
ns
ns
Unit
NOTES:
1. Typical value for t
WHWH1
is 7µs.
2. Typical value for t
WHWH2
is 1sec.
3. Typical value for Chip Erase Time is 32sec.
4. For Toggle and Data Polling.
5. RESET internally tied to Vcc for the default pin configuration in the HIP package.
AC CHARACTERISTICS – READ-ONLY OPERATIONS
(V
CC
= 5.0V, T
A
= -55°C to +125°C)
Parameter
Read Cycle Time
Address Access Time
Chip Select Access Time
Output Enable to Output Valid
Chip Select High to Output High Z (1)
Output Enable High to Output High Z (1)
Output Hold from Addresses, CS or OE Change,
whichever is First
RST Low to Read Mode (1,2)
Symbol
Min
t
AVAV
t
AVQV
t
ELQV
t
GLQV
t
EHQZ
t
GHQZ
t
AXQX
t
RC
t
ACC
t
CE
t
OE
t
DF
t
DF
t
OH
t
Ready
0
20
90
90
90
40
20
20
0
20
-90
Max
Min
120
120
120
50
30
30
0
20
-120
Max
Min
150
150
150
55
35
35
-150
Max
ns
ns
ns
ns
ns
ns
ns
µs
Unit
1. Guaranteed by design, not tested.
2. RESET internally tied to Vcc for the default pin configuration in the HIP package.
White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
4
WF2M32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS CONTROLLED
(V
CC
= 5.0V, V
SS
= 0V, T
A
= -55°C to +125°C)
Parameter
Write Cycle Time
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
Chip Select Pulse Width High
Duration of Byte Programming Operation (1)
Sector Erase Time (2)
Read Recovery Time
Chip Programming Time
Chip Erase Time (3)
Output Enable Hold Time (4)
NOTES:
1. Typical value for t
WHWH1
is 7µs.
2. Typical value for t
WHWH2
is 1sec.
3. Typical value for Chip Erase Time is 32sec.
4. For Toggle and Data Polling.
t
OEH
10
Symbol
Min
t
AVAV
t
WLEL
t
ELEH
t
AVEL
t
DVEH
t
EHDX
t
ELAX
t
EHEL
t
WHWH1
t
WHWH2
t
GHEL
0
44
256
10
t
WC
t
WS
t
CP
t
AS
t
DS
t
DH
t
AH
t
CPH
90
0
45
0
45
0
45
20
300
15
0
44
256
10
-90
Max
Min
120
0
50
0
50
0
50
20
300
15
0
44
256
-120
Max
Min
150
0
50
0
50
0
50
20
300
15
-150
Max
ns
ns
ns
ns
ns
ns
ns
ns
µs
sec
µs
sec
sec
ns
Unit
FIG. 3
AC TEST CIRCUIT
Current Source
I
OL
AC TEST CONDITIONS
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
D.U.T.
V
Z
Typ
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5
Unit
V
ns
V
V
≈
1.5V
Output Timing Reference Level
C
eff
= 50 pf
(Bipolar Supply)
CS
Current Source
I
OH
The
NOTES:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z
0
= 75
Ω.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
rising
tester includes
last WE signal
ATE
edge of the
jig capacitance.
WE
FIG. 4
RESET TIMING DIAGRAM
RY/BY
t
BUSY
RESET
t
RP
t
Ready
Entire programming
or erase operations
5
White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
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