Changes to DC Specifications in B Version, B Chips,
Unit, and Test Conditions/Comments Columns................. 2
Changes to Absolute Maximum Rating..................................... 4
Changes to FR
IN
A Function Test ................................................ 5
Changes to Figure 8...................................................................... 7
New Graph Added—TPC 22....................................................... 9
Change to PD Polarity Box in Table V..................................... 15
Change to PD Polarity Box in Table VI ................................... 16
Change to PD Polarity Paragraph ............................................ 17
Addition of New Material
(PCB Design Guidelines for Chip–Scale package) ........... 23
Replacement of CP-20 Outline with CP-20 [2] Outline........ 24
Rev. C | Page 2 of 28
ADF4110/ADF4111/ADF4112/ADF4113
SPECIFICATIONS
AV
DD
= DV
DD
= 3 V ± 10%, 5 V ± 10%; AV
DD
≤V
P
≤ 6.0 V; AGND = DGND = CPGND = 0 V; R
SET
= 4.7 kΩ; dBm referred to 50 Ω; T
A
=
T
MIN
to T
MAX
, unless otherwise noted. Operating temperature range is as follows: B Version: −40°C to +85°C.
Table 1.
Parameter
RF CHARACTERISTICS (3 V)
RF Input Sensitivity
RF Input Frequency
ADF4110
ADF4110
ADF4111
ADF4112
ADF4112
ADF4113
Maximum Allowable Prescaler Output
Frequency
2
RF CHARACTERISTICS (5 V)
RF Input Sensitivity
RF Input Frequency
ADF4110
ADF4111
ADF4112
ADF4113
ADF4113
Maximum Allowable Prescaler Output
Frequency
2
REFIN CHARACTERISTICS
REFIN Input Frequency
Reference Input Sensitivity
REFIN Input Capacitance
REFIN Input Current
PHASE DETECTOR FREQUENCY
4
CHARGE PUMP
I
CP
Sink/Source
High Value
Low Value
Absolute Accuracy
R
SET
Range
I
CP
3-State Leakage Current
Sink and Source Current Matching
I
CP
vs. V
CP
I
CP
vs. Temperature
LOGIC INPUTS
V
INH
, Input High Voltage
V
INL
, Input Low Voltage
I
INH
/I
INL
, Input Current
C
IN
, Input Capacitance
LOGIC OUTPUTS
V
OH
, Output High Voltage
V
OL
, Output Low Voltage
B Version
−15/0
80/550
50/550
0.08/1.2
0.2/3.0
0.1/3.0
0.2/3.7
B Chips
1
−15/0
80/550
50/550
0.08/1.2
0.2/3.0
0.1/3.0
0.2/3.7
Unit
dBm min/max
MHz min/max
MHz min/max
GHz min/max
GHz min/max
GHz min/max
GHz min/max
For lower frequencies, ensure slew rate
(SR) > 30 V/µs.
Input level = −10 dBm.
For lower frequencies, ensure SR > 30 V/µs.
For lower frequencies, ensure SR > 75 V/µs.
Input level = −10 dBm.
Input level = −10 dBm. For lower frequencies,
ensure SR > 130 V/µs.
Test Conditions/Comments
See Figure 29 for input circuit.
165
−10/0
80/550
0.08/1.4
0.1/3.0
0.2/3.7
0.2/4.0
200
5/104
0.4/AV
DD
3.0/AV
DD
10
±100
55
165
−10/0
80/550
0.08/1.4
0.1/3.0
0.2/3.7
0.2/4.0
200
5/104
0.4/AV
DD
3.0/AV
DD
10
±100
55
MHz max
dBm min/max
MHz min/max
GHz min/max
GHz min/max
GHz min/max
GHz min/max
MHz max
MHz min/max
V p-p min/max
V p-p min/max
pF max
µA max
MHz max
For f < 5 MHz, ensure SR > 100 V/µs.
AV
DD
= 3.3 V, biased at AV
DD
/2. See Note 3.
AV
DD
= 5 V, biased at AV
DD
/2. See Note 3.
For lower frequencies, ensure SR > 50 V/µs.
For lower frequencies, ensure SR > 50 V/µs.
For lower frequencies, ensure SR > 75 V/µs.
For lower frequencies, ensure SR > 130 V/µs.
Input level = −5 dBm
5
625
2.5
2.7/10
1
2
1.5
2
0.8 × DV
DD
0.2 × DV
DD
±1
10
DV
DD
– 0.4
0.4
5
625
2.5
2.7/10
1
2
1.5
2
0.8 × DV
DD
0.2 × DV
DD
±1
10
DV
DD
– 0.4
0.4
mA typ
µA typ
% typ
kΩ typ
nA typ
% typ
% typ
% typ
V min
V max
µA max
pF max
V min
V max
Programmable (see Table 9).
With R
SET
= 4.7 kΩ
With R
SET
= 4.7 kΩ
See Table 9.
0.5 V ≤ V
CP
≤ V
P
– 0.5 V.
0.5 V ≤ V
CP
≤ V
P
– 0.5 V.
V
CP
= V
P
/2.
I
OH
= 500 µA.
I
OL
= 500 µA.
Rev. C | Page 3 of 28
ADF4110/ADF4111/ADF4112/ADF4113
Parameter
POWER SUPPLIES
AV
DD
DV
DD
V
P
I
DD5
(AI
DD
+ DI
DD
)
ADF4110
ADF4111
ADF4112
ADF4113
I
P
Low Power Sleep Mode
NOISE CHARACTERISTICS
ADF4113 Normalized Phase Noise Floor
6
Phase Noise Performance
7
ADF4110: 540 MHz Output
8
ADF4111: 900 MHz Output
9
ADF4112: 900 MHz Output
9
ADF4113: 900 MHz Output
9
ADF4111: 836 MHz Output
10
ADF4112: 1750 MHz Output
11
ADF4112: 1750 MHz Output
12
ADF4112: 1960 MHz Output
13
ADF4113: 1960 MHz Output
13
ADF4113: 3100 MHz Output
14
Spurious Signals
ADF4110: 540 MHz Output
9
ADF4111: 900 MHz Output
9
ADF4112: 900 MHz Output
9
ADF4113: 900 MHz Output
9
ADF4111: 836 MHz Output
10
ADF4112: 1750 MHz Output
11
ADF4112: 1750 MHz Output
12
ADF4112: 1960 MHz Output
13
ADF4113: 1960 MHz Output
13
ADF4113: 3100 MHz Output
14
B Version
2.7/5.5
AV
DD
AV
DD
/6.0
5.5
5.5
7.5
11
0.5
1
−215
−91
−87
−90
−91
−78
−86
−66
−84
−85
−86
−97/−106
−98/−110
−91/−100
−100/−110
−81/−84
−88/−90
−65/−73
−80/−84
−80/−84
−80/−82
B Chips
1
2.7/5.5
AV
DD
AV
DD
/6.0
4.5
4.5
6.5
8.5
0.5
1
−215
−91
−87
−90
−91
−78
−86
−66
−84
−85
−86
−97/−106
−98/−110
−91/−100
−100/−110
−81/−84
−88/−90
−65/−73
−80/−84
−80/−84
−82/−82
Unit
V min/V max
V min/V max
mA max
mA max
mA max
mA max
mA max
µA typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc typ
dBc typ
dBc typ
dBc typ
dBc typ
dBc typ
dBc typ
dBc typ
dBc typ
dBc typ
@ VCO output
@ 1 kHz offset and 200 kHz PFD frequency
@ 1 kHz offset and 200 kHz PFD frequency
@ 1 kHz offset and 200 kHz PFD frequency
@ 1 kHz offset and 200 kHz PFD frequency
@ 300 Hz offset and 30 kHz PFD frequency
@ 1 kHz offset and 200 kHz PFD frequency
@ 200 Hz offset and 10 kHz PFD frequency
@ 1 kHz offset and 200 kHz PFD frequency
@ 1 kHz offset and 200 kHz PFD frequency
@ 1 kHz offset and 1 MHz PFD frequency
@ 200 kHz/400 kHz and 200 kHz PFD frequency
@ 200 kHz/400 kHz and 200 kHz PFD frequency
@ 200 kHz/400 kHz and 200 kHz PFD frequency
@ 200 kHz/400 kHz and 200 kHz PFD frequency
@ 30 kHz/60 kHz and 30 kHz PFD frequency
@ 200 kHz/400 kHz and 200 kHz PFD frequency
@ 10 kHz/20 kHz and 10 kHz PFD frequency
@ 200 kHz/400 kHz and 200 kHz PFD frequency
@ 200 kHz/400 kHz and 200 kHz PFD frequency
@ 1 MHz/2 MHz and 1 MHz PFD frequency
AV
DD
≤ V
P
≤ 6.0 V. See Figure 25 and Figure 26.
4.5 mA typical
4.5 mA typical
6.5 mA typical
8.5 mA typical
T
A
= 25°C
Test Conditions/Comments
1
2
The B chip specifications are given as typical values.
This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency that
is less than this value.
3
AC coupling ensures AV
DD
/2 bias. See Figure 33 for a typical circuit.
4
Guaranteed by design.
5
T
A
= 25°C; AV
DD
= DV
DD
= 3 V; P = 16; SYNC = 0; DLY = 0; RF
IN
for ADF4110 = 540 MHz; RF
IN
for ADF4111, ADF4112, ADF4113 = 900 MHz.
6
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO, PN
TOT
, and subtracting 20logN (where N is the N divider
value) and 10logF
PFD
: PN
SYNTH
= PN
TOT
– 10logF
PFD
– 20logN.
7
The phase noise is measured with the EVAL-ADF411xEB1 evaluation board and the HP8562E spectrum analyzer. The spectrum analyzer provides the REFIN for the
synthesizer (f
REFOUT
= 10 MHz @ 0 dBm). SYNC = 0; DLY = 0 (Table 7).
8
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; offset frequency = 1 kHz; f
RF
= 540 MHz; N = 2700; loop B/W = 20 kHz.
9
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; offset frequency = 1 kHz; f
RF
= 900 MHz; N = 4500; loop B/W = 20 kHz.
10
f
REFIN
= 10 MHz; f
PFD
= 30 kHz; offset frequency = 300 Hz; f
RF
= 836 MHz; N = 27867; loop B/W = 3 kHz.
11
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; offset frequency = 1 kHz; f
RF
= 1750 MHz; N = 8750; loop B/W = 20 kHz
12
f
REFIN
= 10 MHz; f
PFD
= 10 kHz; offset frequency = 200 Hz; f
RF
= 1750 MHz; N = 175000; loop B/W = 1 kHz.
13
f
REFIN
= 10 MHz; f
PFD
= 200 kHz; offset frequency = 1 kHz; f
RF
= 1960 MHz; N = 9800; loop B/W = 20 kHz.
14
f
REFIN
= 10 MHz; f
PFD
= 1 MHz; offset frequency = 1 kHz; f
RF
= 3100 MHz; N = 3100; loop B/W = 20 kHz.
Rev. C | Page 4 of 28
ADF4110/ADF4111/ADF4112/ADF4113
TIMING CHARACTERISTICS
Guaranteed by design but not production tested. AV
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