N-channel enhancement mode field-effect transistor
Parameter Name | Attribute value |
Is it Rohs certified? | conform to |
Maker | NXP |
package instruction | PLASTIC, LFPAK-4 |
Contacts | 235 |
Reach Compliance Code | _compli |
ECCN code | EAR99 |
Avalanche Energy Efficiency Rating (Eas) | 32 mJ |
Shell connection | DRAIN |
Configuration | SINGLE WITH BUILT-IN DIODE |
Minimum drain-source breakdown voltage | 80 V |
Maximum drain current (Abs) (ID) | 34 A |
Maximum drain current (ID) | 34 A |
Maximum drain-source on-resistance | 0.0275 Ω |
FET technology | METAL-OXIDE SEMICONDUCTOR |
JEDEC-95 code | MO-235 |
JESD-30 code | R-PSSO-G4 |
JESD-609 code | e3 |
Humidity sensitivity level | 1 |
Number of components | 1 |
Number of terminals | 4 |
Operating mode | ENHANCEMENT MODE |
Maximum operating temperature | 175 °C |
Package body material | PLASTIC/EPOXY |
Package shape | RECTANGULAR |
Package form | SMALL OUTLINE |
Peak Reflow Temperature (Celsius) | 260 |
Polarity/channel type | N-CHANNEL |
Maximum power dissipation(Abs) | 74 W |
Maximum pulsed drain current (IDM) | 137 A |
Certification status | Not Qualified |
surface mount | YES |
Terminal surface | Tin (Sn) |
Terminal form | GULL WING |
Terminal location | SINGLE |
Maximum time at peak reflow temperature | 30 |
transistor applications | SWITCHING |
Transistor component materials | SILICON |