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CY7C1361A-133AJCT

Description
Standard SRAM, 256KX36, 6.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
Categorystorage    storage   
File Size739KB,28 Pages
ManufacturerCypress Semiconductor
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CY7C1361A-133AJCT Overview

Standard SRAM, 256KX36, 6.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

CY7C1361A-133AJCT Parametric

Parameter NameAttribute value
MakerCypress Semiconductor
Parts packaging codeQFP
package instructionLQFP,
Contacts100
Reach Compliance Codeunknown
ECCN code3A991.B.2.A
Maximum access time6.5 ns
Other featuresFLOW-THROUGH ARCHITECTURE
JESD-30 codeR-PQFP-G100
length20 mm
memory density9437184 bit
Memory IC TypeSTANDARD SRAM
memory width36
Number of functions1
Number of terminals100
word count262144 words
character code256000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize256KX36
Package body materialPLASTIC/EPOXY
encapsulated codeLQFP
Package shapeRECTANGULAR
Package formFLATPACK, LOW PROFILE
Parallel/SerialPARALLEL
Certification statusNot Qualified
Maximum seat height1.6 mm
Maximum supply voltage (Vsup)3.63 V
Minimum supply voltage (Vsup)3.135 V
Nominal supply voltage (Vsup)3.3 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal formGULL WING
Terminal pitch0.65 mm
Terminal locationQUAD
width14 mm
1CY7C1361A
CY7C1361A/GVT71256B36
CY7C1363A/GVT71512B18
256K x 36/512K x 18 Synchronous Burst Flowthrough SRAM
Features
Fast access times: 6.0, 6.5, 7.0, and 8.0 ns
Fast clock speed: 150, 133, 117, and 100 MHz
1 ns set-up time and hold time
Fast OE access times: 3.5 ns and 4.0 ns
3.3V –5% and +10% power supply
3.3V or 2.5V I/O supply
5V tolerant inputs except I/Os
Clamp diodes to V
SS
at all inputs and outputs
Common data inputs and data outputs
Byte Write Enable and Global Write control
Multiple chip enables for depth expansion:
three chip enables for TA(GVTI)/A(CY) package version
and two chip enables for B(GVTI)/BG(CY) and
T(GVTI)/AJ(CY) package versions
Address pipeline capability
Address, data and control registers
Internally self-timed Write Cycle
Burst control pins (interleaved or linear burst se-
quence)
Automatic power-down for portable applications
JTAG boundary scan for B and T package version
Low profile 119-bump, 14-mm x 22-mm PBGA (Ball Grid
Array) and 100-pin TQFP packages
and a 2-bit counter for internal burst operation. All synchro-
nous inputs are gated by registers controlled by a positive-
edge-triggered Clock Input (CLK). The synchronous inputs in-
clude all addresses, all data inputs, address-pipelining Chip
Enable (CE), depth-expansion Chip Enables (CE
2
and CE
2
),
,
Burst Control Inputs (ADSC, ADSP and ADV), Write Enables
(BWa, BWb, BWc, BWd, and BWE), and Global Write (GW).
However, the CE
2
chip enable input is only available for TA(GV-
TI)/A(CY) package version.
Asynchronous inputs include the Output Enable (OE) and
burst mode control (MODE). The data outputs (Q), enabled by
OE, are also asynchronous.
Addresses and chip enables are registered with either Ad-
dress Status Processor (ADSP) or Address Status Controller
(ADSC) input pins. Subsequent burst addresses can be inter-
nally generated as controlled by the Burst Advance pin (ADV).
Address, data inputs, and write controls are registered on-chip
to initiate self-timed WRITE cycle. WRITE cycles can be one
to four bytes wide as controlled by the write control inputs.
Individual byte write allows individual byte to be written. BWa
controls DQa. BWb controls DQb. BWc controls DQc. BWd
controls DQd. BWa, BWb, BWc, and BWd can be active only
with BWE being LOW. GW being LOW causes all bytes to be
written. The x18 version only has 18 data inputs/outputs (DQa
and DQb) along with BWa and BWb (no BWc, BWd, DQc, and
DQd).
For the B(GVTI)/BG(CY) and T(GVTI)/AJ(CY) package ver-
sions, four pins are used to implement JTAG test capabilities:
Test Mode Select (TMS), Test Data-In (TDI), Test Clock (TCK),
and Test Data-Out (TDO). The JTAG circuitry is used to serially
shift data to and from the device. JTAG inputs use
LVTTL/LVCMOS levels to shift data during this testing mode of
operation. The TA package version does not offer the JTAG
capability.
The GVT71256B36 and GVT71512B18 operate from a +3.3V
power supply. All inputs and outputs are LVTTL compatible.
Functional Description
The Cypress Synchronous Burst SRAM family employs high-
speed, low-power CMOS designs using advanced triple-layer
polysilicon, double-layer metal technology. Each memory cell
consists of four transistors and two high-valued resistors.
The GVT71256B36/CY7C1361A and GVT71512B18/
CY7C1363A SRAMs integrate 262,144x36 and 524,288x18
SRAM cells with advanced synchronous peripheral circuitry
Selection Guide
7C1361A-150
7C1363A-150
71256B36-6
71512B18-6
Maximum Access Time (ns)
Maximum Operating Current (mA)
Maximum CMOS Standby Current (mA)
6.0
400
10
7C1361A-133
7C1363A-133
71256B36-6.5
71512B18-6.5
6.5
360
10
7C1361A-117
7C1363A-117
71256B36-7
71512B18-7
7.0
320
10
7C1361A-100
7C1363A-100
71256B36-8
71512B18-8
8.0
270
10
Cypress Semiconductor Corporation
3901 North First Street
San Jose
CA 95134
408-943-2600
June 11, 2001

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