Approval sheet
Low Profile Series (TT)
MULTILAYER CERAMIC CAPACITORS
Low Profile Series
0402 to 1210 Sizes
X7R, X5R & Y5V Dielectrics
RoHS Compliance
*Contents in this sheet are subject to change without prior notice.
Page 1 of 8
ASC_ Low Profile_(TT)_009M_AS
Oct. 2012
Approval sheet
Low Profile Series (TT)
1. DESCRIPTION
MLCC consists of a conducting material and electrodes. To manufacture a chip-type SMT and achieve miniaturization,
high density and high efficiency, ceramic condensers are used.
WTC TT series MLCC is used in product having thickness concerned generally have high capacitance and thinner
product thickness. The high dielectric constant material X7R, X5R and Y5V are used for this series product.
2. FEATURES
a.
b.
c.
Standard size with thin thickness.
Small size with high capacitance.
Capacitor with lead-free termination (pure Tin).
3. APPLICATIONS
a.
b.
c.
d.
For LCD panels.
For PCMCA cards.
For IC packaging and modules.
Any thickness concerned products.
4. HOW TO ORDER
TT
Series
TT=Low
profile
Size
31
X
Dielectric
225
Capacitance
Two significant
digits followed by
no. of zeros. And
R is in place of
decimal point.
eg.:
225=22x10
5
=2,200,000pF
=2.2µF
K
Tolerance
K=±10%
M=±20%
Z=-20/+80%
100
Rated voltage
C
Termination
T
Packaging style
T=7”
reel (paper
tape)
P=7”
reel (plastic
tape)
15=0402
(1005)
B=X7R
18=0603
(1608)
X=X5R
21=0805
(2012)
F=Y5V
31=1206
(3216)
32=1210
(3225)
Two significant
C=Cu/Ni/Sn
digits followed by
no. of zeros. And
R is in place of
decimal point.
6R3=6.3
VDC
100=10
VDC
160=16
VDC
250=25
VDC
500=50
VDC
5. EXTERNAL DIMENSIONS
Size
Inch (mm)
0402 (1005)
0603 (1608)
0805 (2012)
1206 (3216)
1210 (3225)
L (mm)
1.00±0.05
1.6+0.15/-0.10
2.00±0.20
3.20±0.20
3.20±0.30
W (mm)
0.5±0.05
0.8+0.15/-0.10
1.25±0.20
1.60±0.20
1.30
2.50±0.20
0.95
J
T
0.75±0.25
T max
(mm)/Symbol
0.33
0.60
0.95
0.95
L
H
T
T
0.60±0.20
M
B
(mm)
0.25±0.10
T
L
0.40±0.15
0.50±0.20
M
B
M
B
W
Fig. 1 The outline of MLCC
* Reflow soldering process only is recommended.
Page 2 of 8
ASC_ Low Profile_(TT)_009M_AS
Oct. 2012
Approval sheet
Low Profile Series (TT)
6. GENERAL ELECTRICAL DATA
Dielectric
Size
Capacitance range*
Capacitance tolerance**
Rated voltage (WVDC)
Tan
δ*
Insulation resistance at Ur
Operating temperature
Capacitance characteristic
Termination
-55 to +125°
C
±15%
Ni/Sn (lead-free termination)
25V
25V:
≤10%
X7R
1206
1.0µF
K (±10%), M (±20%)
6.3V, 10V, 16V, 25V
25V, 16V, 10V:
≤10%;
6.3V:
≤15.0%
RxC≥100 xF
-55 to +85°
C
-25 to +85°
C
+30/-80%
X5R
0402, 0603, 0805, 1206, 1210
0.22µF to 10µF
1.0µF to 10µF
Z (-20/+80%)
10V, 16V, 25V, 50V
50V:
≤7.0%
25V:
≤9.0%
16V, 10V:
≤12.5%
Y5V
* Measured at 1.0±0.2Vrms, 1.0kHz±10%, 30~70% related humidity, 25° ambient temperature for X7R, X5R and at 20° for Y5V.
C
C
** Preconditioning for Class II MLCC: Perform a heat treatment at 150±10° for 1 hour, then leave in a mbient condition for 24±2 hours
C
before measurement.
7. CAPACITANCE RANGE
7-1 X7R & X5R dielectric
Dielectric
Size
Rated voltage (VDC)
0.22uF (224)
0.47uF (474)
1.0µF (105)
1.5µF (155)
2.2µF (225)
3.3µF (335)
4.7µF (475)
6.8µF (685)
10µF (106)
22uF (226)
X7R
1206
25
X5R
0402
6.3
25
L
L
L
0603
10
H
H
16
H
H
T
T
T
T
6.3
0805
10
16
25
6.3
1206
10
16
25
50
1210
10
25
Capacitance
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
J
T
J/T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
7-2 Y5V dielectric
Dielectric
Size
Rated voltage (VDC)
1.0µF (105)
Y5V
0805
10
16
25
50
T
10
16
1206
25
50
10
1210
16
Capacitance
1.5µF (155)
2.2µF (225)
3.3µF (335)
4.7µF (475)
6.8µF (685)
10µF (106)
22µF (226)
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
8. PACKAGING STYLE AND QUANTITY
Size
0402 (1005)
0603 (1608)
0805 (2012)
1206 (3216)
1210 (3225)
Thickness Max (mm)/Symbol
0.33
0.60
0.95
0.95
1.30
0.95
L
H
T
T
J
T
7” reel
Paper tape
15k
4k
4k
4k
-
-
Plastic tape
-
-
-
-
3k
3k
Unit: pieces
Page 3 of 8
ASC_ Low Profile_(TT)_009M_AS
Oct. 2012
Approval sheet
Low Profile Series (TT)
9. RELIABILITY TEST CONDITIONS AND REQUIREMENTS
No.
1.
2.
3.
Item
Visual and
Mechanical
Capacitance
Q/ D.F.
(Dissipation
Factor)
Cap≤10µF, 1.0±0.2Vrms, 1kHz±10%
Cap>10µF, 0.5±0.2Vrms, 120Hz±20%**
** Test condition: 0.5±0.2Vrms，1KHz±10%
TT18X≧475(10V) , TT15X series
---
Test Condition
* No remarkable defect.
Requirements
* Dimensions to conform to individual specification sheet.
* Shall not exceed the limits given in the detailed spec.
X7R/X5R:
Rated vol.
25V, 16V, 10V
6.3V
Y5V:
Rated vol.
50V
25V
16V/10V
D.F.
≤7%
≤9%
≤12.5%
D.F.
≤10%
≤15%
4.
Dielectric
Strength
* To apply voltage: 250% rated voltage.
* Duration: 1 to 5 sec.
* Charge and discharge current less than 50mA.
* No evidence of damage or flash over during test.
5.
Insulation
Resistance
To apply rated voltage for max. 120 sec.
≥10G
or RxC≥100 -F whichever is smaller.
6.
Temperature
Coefficient
With no electrical load.
T.C.
X7R
X5R
Y5V
Operating Temp
-55~125° at 25°C
C
-55~85° at 25°
C
C
-25~85° at 20°
C
C
T.C.
X7R
X5R
Y5V
Capacitance Change
Within ±15%
Within ±15%
Within +30%/-80%
7.
Adhesive
Strength of
Termination
* Pressurizing force：5N (≤0603) and 10N (>0603)
* Test time: 10±1 sec.
* No remarkable damage or removal of the terminations.
8.
Vibration
Resistance
* Vibration frequency: 10~55 Hz/min.
* Total amplitude: 1.5mm
* Test time: 6 hrs. (Two hrs each in three mutually
perpendicular directions.)
* Measurement to be made after keeping at room temp. for
24±2 hrs.
* No remarkable damage.
* Cap change and Q/D.F.: To meet initial spec.
9.
10.
Solderability
* Solder temperature: 235±5°
C
* Dipping time: 2±0.5 sec.
95% min. coverage of all metalized area.
Bending Test
* The middle part of substrate shall be pressurized by means
* No remarkable damage.
of the pressurizing rod at a rate of about 1 mm per second until * Cap change：
the deflection becomes 1 mm and then the pressure shall be
maintained for 5±1 sec.
* Measurement to be made after keeping at room temp. for
24±2 hrs..
X7R/X5R: within ±12.5%
Y5V: within ±30%
(This capacitance change means the change of capacitance under
specified flexure of substrate from the capacitance measured before
the test.)
11.
Resistance to
* Solder temperature: 260±5°
C
* No remarkable damage.
* Cap change:
X7R/X5R: within ±7.5%
Y5V: within ±20%
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
* 25% max. leaching on each edge.
Soldering Heat
* Dipping time: 10±1 sec
* Preheating: 120 to 150° for 1 minute before imme rse the
C
capacitor in a eutectic solder.
* Before initial measurement (Class II only): Perform
150+0/-10° for 1 hr and then set for 24±2 hrs at r oom temp.
C
* Measurement to be made after keeping at room temp. for
24±2 hrs.
Page 4 of 8
ASC_ Low Profile_(TT)_009M_AS
Oct. 2012
Approval sheet
Low Profile Series (TT)
No.
12.
Item
Temperature
Cycle
time.
Step
1
2
3
4
Test Condition
* Conduct the five cycles according to the temperatures and
Temp. (°
C)
Min. operating temp. +0/-3
Room temp.
Max. operating temp. +3/-0
Room temp.
Time (min.)
30±3
2~3
30±3
2~3
* Cap change：
Requirements
* No remarkable damage.
X7R/X5R: within ±7.5%
Y5V: within ±20%
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
* Before initial measurement (Class II only): Perform
150+0/-10° for 1 hr and then set for 24±2 hrs at r oom temp.
C
* Measurement to be made after keeping at room temp. for
24±2 hrs.
13.
Humidity
(Damp Heat)
Steady State
* Test temp.: 40±2°
C
* Humidity: 90~95% RH
* Test time: 500+24/-0hrs.
*Before initial measurement (Class II only): Perform
150+0/-10° for 1 hr and then set for 24±2 hrs at r oom temp.
C
* Measurement to be made after keeping at room temp. for
24±2 hrs.
*No remarkable damage.
*Cap change： X7R/X5R: within ±25%
Y5V: within ±30%; 6.3V, within +30/-40%
*Q/D.F. value:
X7R/X5R:
Rated vol.
25V, 16V
10V
6.3V
Y5V:
Rated vol.
50V
25V
16V, 10V
D.F.
≤10%
≤15%
≤20%
D.F.
≤15%
≤20%
≤30%
14.
Humidity
(Damp Heat)
Load
* Test temp.: 40±2°
C
* Humidity: 90~95%RH
* Test time: 500+24/-0 hrs.
* To apply voltage：Rated voltage.
* Before initial measurement (Class II only): To apply test
voltage for 1hr at 40° and then set for 24±2 hrs a t room temp.
C
* Measurement to be made after keeping at room temp. for
24±2 hrs.
*I.R.:
1G or RxC≧10 -F whichever is smaller.
*No remarkable damage.
*Cap change: X7R/X5R: within ±25%
Y5V: within ±30%; 6.3V, within +30/-40%
*Q/D.F. value:
X7R/X5R:
Rated vol.
25V, 16V
10V
6.3V
Y5V:
Rated vol.
50V
25V
16V, 10V
D.F.
≤10%
≤15%
≤20%
D.F.
≤15%
≤20%
≤30%
*I.R.:
500M or RxC≧5 -F whichever is smaller.
15.
High
Temperature
Load
(Endurance)
* Test temp.：
NP0, X7R/X7E: 125±3°C
X5R, Y5V: 85±3°
C
* Test time: 1000+24/-0 hrs.
* To apply voltage: 150% of rated voltage.
**100% of rated voltage for below range.
*No remarkable damage.
*Cap change: X7R/X5R: within ±25%
Y5V: within ±30%; 6.3V, within +30/-40%
*Q/D.F. value:
X7R/X5R:
Capacitance
range
C≧2.2µF
C≧10µF
C≧22µF
Y5V:
Rated vol.
50V
25V
16V, 10V
D.F.
≤10%
≤15%
≤20%
Rated vol.
25V, 16V
10V
6.3V
D.F.
≤15%
≤20%
≤30%
Size
TT18
TT21
TT31
Dielectric
Y5V
Y5V
Y5V
Rated voltage
6.3V,10V
6.3V
6.3V
*Before initial measurement (Class II only): To apply test
voltage for 1hr at test temp. and then set for 24±2 hrs at room
temp.
*Measurement to be made after keeping at room temp. for
24±2 hrs
*I.R.:
1G or RxC≧10 -F whichever is smaller.
Page 5 of 8
ASC_ Low Profile_(TT)_009M_AS
Oct. 2012
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