Spec.No.
JENF243H-9101B-01
Reference Only
P 1/ 13
SMD Block Type EMIFIL ®
BNX02□H01□
Murata Standard Reference Specification [AEC-Q200]
1.Scope
This reference specification applies to Block Type EMIFIL
®
BNX02□H01 Series for Automotive Electronics based on
AEC-Q200.
2.Part Numbering
BN
Product ID
X
Type
024
H
01
L
Serial No. Category
Features
Packaging Code
（for
Automotive Electronics）(L :Taping(
φ
178mm reel) / K :Taping(
φ
330mm reel) / B :Bulk)
3.Rating
Customer’s
Part Number
ESD
Rated
DC
Insulation
Insertion
Voltage
Rated Withstanding
Rank
Current
Part Number Capacitance
Resistance Resistance
Loss
Drop
Voltage
Voltage
2:2kV
∗
BNX024H01L
35dB min.
4.7μF
50V
125V
20A
0.43mΩ
100MΩ
45 mV
(100kHz to
BNX024H01K
max.
±15%
(DC)
(DC)
(DC) ±0.20mΩ
min.
1GHz)
BNX024H01B
BNX025H01L
35dB min.
10μF
25V
62.5V
20A
0.43mΩ
50MΩ
45mV
BNX025H01K
(50 kHz to
±15%
(DC)
(DC)
(DC) ±0.20mΩ
min.
max.
1GHz)
BNX025H01B
2
BNX026H01L
35dB min.
10μF
50V
125V
20A
0.43mΩ
10MΩ
45mV
BNX026H01K
(50KHz to
10
(DC)
(DC)
(DC) ±0.20mΩ
min.
max.
±20%
1GHz)
BNX026H01B
BNX027H01L
35dB min.
22μF
16V
40V
20A
0.43mΩ
1MΩ
45mV
(40KHz to
BNX027H01K
20
(DC)
(DC)
(DC) ±0.20mΩ
min.
max.
±40%
1GHz)
BNX027H01B
∗
Rated current is derated according to operating temperature.
•
Operating Temperature : - 55 °C to + 125 °C
Rated Current (A)
•
Storage Temperature : - 55 °C to + 125 °C
20
15
1
85
Operating Temperature (°C)
125
4.Standard Testing Condition
<Unless otherwise specified>
Temperature : Ordinary Temp. 15 °C to 35 ºC
Humidity : Ordinary Humidity 25 %(RH) to 85 %(RH)
<In case of doubt>
Temperature : 20 °C ± 2 °C
Humidity : 60 %(RH) to 70 %(RH)
Atmospheric pressure : 86kPa to 106kPa
MURATA MFG.CO.,LTD.
Spec.No.
JENF243H-9101B-01
Reference Only
P 2/ 13
5.Style and Dimensions
※Coplanarity
0.10mm max.
■Equivalent
Circuit
Ｌ１
①
Ｌ２
③
Ｃ１
④
Ｌ３
Ｃ２
②
①B ：Bias
②CB ：Circuit
+ Bias
③PSG ：Power
Supply Ground
④CG ：Circuit
Ground
■
Unit Mass(Typical value)
0.86g
6.Marking
Filter shall be marked as follows.
(1) Murata Mark :
(2) Part Number : BNX024H01：（
ＢＮＸ０２４
）
BNX025H01：（
ＢＮＸ０２５
）
BNX026H01：（
ＢＮＸ０２６
）
BNX027H01：（
ＢＮＸ０２７
）
(3) Polarity Marking :
○
MURATA MFG.CO.,LTD.
Spec.No.
JENF243H-9101B-01
Reference Only
Specification
Test Method
50
Ω
10dB
Attenuator
50
Ω
Balun
(1)
(2)
50
Ω
10dB
Attenuator
P 3/ 13
7.Electrical Performance
No.
7.1
Item
Insertion
Loss
Meet item 3.
Specimen
(3)
(4)
E
½
SG
50
Ω
-STD
-220
∗
Method of measurement based on MIL
7.2
Capacitance
7.3
7.4
DC
Resistance
Insulation
Resistance
Insertion Loss = -20 log E
1
/E
0
(dB)
E
0
: Level without FILTER (short)
E
1
: Level with FILTER
Measuring Equipment : Agilent 8753C or the equivalent
Measured by the following condition between
Terminal
①②
and
③④.
(see item 5.)
Frequency : 1 ± 0.1kHz (except BNX027)
120 ± 24kHz (BNX027)
Voltage : 1 V(rms) max. (except BNX027)
0.5±0.1V(rms) (BNX027)
Measuring Equipment :
HP 4278A or the equivalent (except BNX027)
HP 4284A or the equivalent (BNX027)
Measured by the way of 4 terminal method between①
and
②
and between
③
and
④.
(see item 5.)
Measured at DC rated voltage between terminal
①②
and
③④.
(see item 5.)
Time : 60 s max
Charging current : 50 mA max.
Measuring Equipment : R8340A or the equivalent
Withstanding voltage shall be applied between terminal
①
②
and
③④.
(see item 5.)
Test Voltage : BNX024 125V(DC)
BNX025 62.5V(DC)
BNX026 125V(DC)
BNX027 40V(DC)
Time : 5 ± 1 s
Charging current : 50 mA max.
After soldering the part on the test substrate, measure
the voltage with passing the rated current as shown in the
schematic below.
A
V
(1)
Specimen
(2)
7.5
Withstanding
Voltage
Filter shall be no failure.
7.6
Voltage
Drop
Meet item 3.
Where the terminals of the part shall be connected as
follows:
Referring to the terminal No. shown in item 5,
connect terminal No.
②
and
④
by soldering
copper wire with diameter more than 1mm /
length less than 6mm.
Then connect terminal No.
①
as (1) and terminal
No.
③
as (2) the measurement circuit as
mentioned above.
The probe for measuring the voltage shall be
touched on the solder fillet of
①③.
MURATA MFG.CO.,LTD.
Spec.No.
JENF243H-9101B-01
Reference Only
P 4/ 13
8. Q200 Requirement
8-1. Performance (based on Table 13 for Ferrite EMI SUPPRESSORS/FILTERS)
AEC-Q200 Rev.D issued June. 1 2010
No.
Stress
3
High
Temperature
Exposure
(Storage)
4
Temperature
Cycling
5
Destructive
Physical
Analysis
Biased
Humidity
AEC-Q200
Test Method
1000hours at 125C
Set for 24hours
at room temperature,
then measured.
1000cycles(-55C to 125C)
Measurement at 24±2 hours
after test conclusion.
Per EIA469
No electrical tests
Murata Specification / Deviation
Meet Table A after testing.
Meet Table A after testing.
Not Applicable
7
Meet Table B after testing.
1000hours 85C/85%RH.
Apply Maximum
rated Voltage.
8
Measurement at 24+/-2 hours
after test conclusion.
Operational Life 1000hours at 125C
Meet Table A after testing.
Apply Maximum rated
Voltage.
Measurement at 24+/-2 hours
after test conclusion.
Visual inspection
No abnormalities
Meet ITEM 4
No defects
(Style and Dimensions)
Per MIL-STD-202 Method 215 Not Applicable
Per MIL-STD-202 Method 213
Figure 1 of Method 213.
Condition
F(1500g's/0.5ms/Half sine)
Three times each 6 direction.
5g's for 20 minutes, 12cycles
each of 3 oritentations
Osscillation Frequency :
10-2000Hz.
No heating.
260C +/- degree C
Immersion time 10s
Per AEC-Q200-002
Meet Table C after testing.
9
10
12
13
External Visual
Physical
Dimension
Resistance
to Solvents
Mechanical
Shock
14
Vibration
Meet Table C after testing.
15
17
Resistance
to Soldering
Heat
ESD
Pre-heating: 150C+/-5C, 60s+/-5s
Meet Table D after testing.
Meet Table C after testing.
ESD Rank: Refer to Item 3. Rating.
Method b : Not Applicable
75% of the terminations is to be soldered.
No defects
Not Applicable
Meet Table D after testing.
18
19
20
21
Solderbility
Per J-STD-002
22
30
Electrical
Measured :Capacitance
Characterization
Flammability
Per UL-94
Board Flex
Epoxy-PCB(1.6mm)
Deflection 2mm(min)
60s minimum holding time
Terminal
Per AEC-Q200-006
Strength
A force of 17.7N
for 60sec
Electrical
Per ISO-7637-2
Transient
Conduction
17.7N for 60sec
No defects
Not Applicable
MURATA MFG.CO.,LTD.
Spec.No.
JENF243H-9101B-01
Reference Only
P 5/ 13
Tab
le A
Appearance
Capacitance Change
No damaged
Within +/-12.5% (BNX024/BNX025)
Within +/-15%
(BNX026/BNX027)
10MΩ min. (BNX024)
5M
Ω
min. (BNX025)
1MΩ min.
(BNX026)
0.1M
Ω
min. (BNX027)
I.R.
Tabl
e B
Appearance
Capacitance Change
No damaged
Within +/-12.5% (BNX024/BNX025)
Within +/-15%
(BNX026/BNX027)
5MΩ min.
(BNX024)
2.5M
Ω
min. (BNX025)
1MΩ min.
(BNX026)
0.1M
Ω
min. (BNX027)
I.R.
Table
C
Appearance
Capacitance Change
I.R.
Withstanding Voltage
No damaged
Within +/-15%
100MΩ min. (BNX024)
50M
Ω
min. (BNX025)
10MΩ min.
(BNX026)
1M
Ω
min.
(BNX027)
No damaged
Table
D
Appearance
Capacitance Change
No damaged
Within +/-7.5% (BNX024/BNX025)
Within +/-15%
(BNX026/BNX027)
100MΩ min. (BNX024)
50M
Ω
min. (BNX025)
10MΩ min.
(BNX026)
1M
Ω
min.
(BNX027)
No damaged
I.R.
Withstanding Voltage
<About BNX026,BNX027>
·
Initial values: measured after heat treatment (150±
010
°C, 1hour) and exposure in the room condition for 24±2 hours.
·Values
After Testing:measured after heat treatment (150±
010
°C, 1hour) and exposure in the room condition for 24±2 hours.
MURATA MFG.CO.,LTD.
Analog electronics
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