CHIP MONOLITHIC CERAMIC CAPACITOR FOR AUTOMOTIVE
GCM21BR70J106KE22_ (0805, X7R, 10uF, 6.3Vdc)
_: packaging code
1.Scope
Reference Sheet
This product specification is applied to Chip Monolithic Ceramic Capacitor used for Automotive Electronic equipment.
2.MURATA Part NO. System
(Ex.)
GCM
21
(1)L/W
Dimensions
B
(2)T
Dimensions
R7
(3)Temperature
Characteristics
0J
(4)DC Rated
Voltage
106
K
E22
L
(5)Nominal (6)Capacitance
Tolerance
Capacitance
(7)Murata’s (8)Packaging
Code
Control Code
3. Type & Dimensions
L
W
T
e
g
e
(1)-1 L
2.0±0.15
(1)-2 W
1.25±0.15
(2) T
1.25±0.15
e
0.2 to 0.7
(Unit:mm)
g
0.7 min.
4.Rated value
(3) Temperature Characteristics
(Public STD Code):X7R(EIA)
Temp. coeff
Temp. Range
or Cap. Change
(Ref.Temp.)
(4)
DC Rated
Voltage
(6)
(5) Nominal
Capacitance
Capacitance
Tolerance
Specifications and Test
Methods
(Operationg
Temp. Range)
-15 to 15 %
-55 to 125 °C
(25 °C)
6.3 Vdc
10 uF
±10 %
-55 to 125 °C
5.Package
mark
L
K
(8) Packaging
f180mm
Reel
EMBOSSED W8P4
f330mm
Reel
EMBOSSED W8P4
Packaging Unit
3000 pcs./Reel
10000 pcs./Reel
Product specifications in this catalog are as of Jan.26,2013,and are subject to change or obsolescence without notice.
Please consult the approval sheet before ordering.
Please read rating and !Cautions first.
GCM21BR70J106KE22-01
1
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Pre-and Post-Stress
1
Electrical Test
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
Capacitance
Change
Dissipation
Factor
R7: 0.2max
No marking defects
R7: Within ±10％
-
Set the capacitor for 1000±12 hours at 150±3℃. Set for
24±2 hours at room temperature, then measure.
2 High Temperature
Exposure (Storage)
Specification.
AEC-Q200 Test Method
Insulation
Resistance
3 Temperature Cycling
50Ω
・F
min.
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
Capacitance
Change
Dissipation
Factor
R7: 0.2max
No marking defects
R7: Within ±7.5%
Fix the capacitor to the supporting jig in the same manner and under
the same conditions as (19). Perform the 1000 cycles test according to
the four heat treatments listed in the following table. Set for 24±2 hours at
room temperature, then measure
Step
Temp.
(C)
1
-55+0/-3
153
2
Room
Temp.
1
3
125+3/-0
153
4
Room
Temp.
1
Insulation
Resistance
50Ω
・F
min.
Time
(min.)
・
Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10
℃
for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
4 Destructive
Phisical Analysis
5 Moisture Resistance
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
Capacitance
Change
Dissipation
Factor
R7: 0.2max
No marking defects
R7: Within ±10%
Apply the 24-hour heat (25 to 65℃) and humidity (80 to 98%)
treatment shown below, 10 consecutive times.
Set for 24±2 hours at room temperature, then measure.
Temperature
(℃)
70
65
60
55
50
45
40
35
30
25
20
15
10
5
0
-5
-10
Humidity
90½98%
Humidity
80½98%
Humidity
90½98%
Humidity
80½98% Humidity
90½98%
No defects or abnormalities
Per EIA-469
Insulation
Resistance
50Ω
・F
min.
+10
- 2
℃
Initial measuremt
One cycle 24hours
0
1 2
3
4 5
6
7
8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Hours
・Measurement
after test for high dielectric constant type
Perform a heat treatment at 150+0/–10°C for one hour and then let
sit for 24±2 hours at room temperature, then measure.
6 Biased Humidity
Appearance
Capacitance
Change
Dissipation
Factor
Insulation
Resistance
5Ω
・F
min.
R7: 0.2 max
・
Measurement after test for high dielectric constant type
Perform a heat treatment at 150+0/–10°C for one hour and then let
sit for 24±2 hours at room temperature, then measure.
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
R7: Within ±10%
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
at 85±3℃ and 80 to 85% humidity for 1000±12 hours.
Remove and set for 24±2 hours at room temprature, then measure.
The charge/discharge current is less than 50mA.
JEMCGS-0735G
2
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specification.
The measured and observed characteristics should satisfy the
specifications in the following table.
AEC-Q200 Test Method
Apply 150% of the rated voltage for 1000±12 hours at 125±3℃.
Set for 24±2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
・Initial
measurement for high dielectric constant type
7 Operational Life
Appearance
Capacitance
Change
Dissipation
Factor
No marking defects
R7: Within ±12.5%
R7: 0.2max
Perform a heat treatment at 150+0/-10℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
・
Measurement after test for high dielectric constant type
Insulation
Resistance
8 External Visual
5Ω
・F
min.
Perform a heat treatment at 150+0/–10°C for one hour and then let
sit for 24±2 hours at room temperature, then measure.
No defects or abnormalities
Visual inspection
9 Phisical Dimension
Within the specified dimensions
Using calipers
10 Resistance to
Solvents
Appearance
Capacitance
Change
Dissipation
Factor
No marking defects
Within the specified tolerance
Per MIL-STD-202 Method 215
Solvent 1 : 1 part (by volume) of isopropyl alcohol
3 parts (by volume) of mineral spirits
R7: 0.1max
Solvent 2 : Terpene defluxer
Solvent 3 : 42 parts (by volume) of water
1part (by volume) of propylene glycol monomethylether
1 part (by volume) of monoethanolomine
Insulation
Resistance
50Ω
・
Fmin.
11 Mechanical
Shock
Appearance
Capacitance
Change
Dissipation
Factor
No marking defects
Within the specified tolerance
Three shocks in each direction should be applied along 3 mutually
perpendicular axes of the test specimen (18 shocks).
The specified test pulse should be Half-sine and should have a
R7: 0.1max
duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.
Insulation
Resistance
12 Vibration
Appearance
Capacitance
Change
Dissipation
Factor
50Ω
・F
min.
No defects or abnormalities
Within the specified tolerance
Solder the capacitor to the test jig (glass epoxy board) in the same
manner and under the same conditions as (19). The capacitor
should be subjected to a simple harmonic motion having a total
R7: 0.1max
amplitude of 1.5mm, the frequency being varied uniformly between
the approximate limits of 10 and 2000Hz. The frequency range, from
10 to 2000Hz and return to 10Hz, should be traversed in
approximately 20 minutes. This motion should be applied for 12
Insulation
Resistance
50Ω
・F
min.
items in each 3 mutually perpendicular directions (total of 36 times).
13 Resistance to
Soldering Heat
Appearance
Capacitance
Change
Dissipation
Factor
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Within the specified tolerance
Immerse the capacitor in a eutectic solder solution at 260±5℃ for
10±1 seconds. Set at room temperature for 24±2 hours, then
measure.
・
Initial measurement for high dielectric constant type
R7: 0.1max
Perform a heat treatment at 150+0/-10
℃
for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
Insulation
Resistance
50Ω
・F
min.
JEMCGS-0735G
3
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Specification.
The measured and observed characteristics shall satisfy the
specifications in the following table.
Appearance
Capacitance
Change
Dissipation
Factor
Temp.(℃）
Time
(min.）
-55+0/-3
15±3
125+3/-0
15±3
AEC-Q200 Test Method
Fix the capacitor to the supporting jig in the same manner and under
the same conditions as (19). Perform the 300 cycles according to
the two heat treatments listed in the following table(Maximum
transfer time is 20 seconds). Set for 24±2 hours at room
temperature, then measure
Step
1
2
14 Thermal Shock
No marking defects
R7: Within ±10.0%
R7: 0.1max
Insulation
Resistance
50Ω
・F
min.
・
Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10
℃ for
one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
15 ESD
Appearance
Capacitance
Change
Dissipation
Factor
No marking defects
Within the specified tolerance
R7: 0.1max
Per AEC-Q200-002
Insulation
Resistance
16 Solderability
50Ω
・F
min.
95% of the terminations is to be soldered evenly and continuously.
(a) Preheat at 155℃ for 4 hours. After preheating, immerse the
capacitor
in a solution of ethanol(JIS-K-8101) and rosin (JIS-K-
5902)
(25% rosin in weight propotion). Immerse in
eutectic
solder solution for 5+0/-0.5 seconds at 235±5℃.
(b) Should be placed into steam aging for 8 hours±15 minutes.
After
preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101)
and rosin (JIS-K-5902) (25% rosin in weight
propotion).
Immerse in eutectic solder solution for 5+0/-0.5
seconds
at 235±5℃.
(c) Should be placed into steam aging for 8 hours±15 minutes.
After
preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101)
and rosin (JIS-K-5902) (25% rosin in weight
propotion).
Immerse in eutectic solder solution for 120±5
seconds at 260±5℃.
17 Electrical
Chatacteri-
zation
Appearance
Capacitance
Change
Dissipation
Factor
No defects or abnormalities
Within the specified tolerance
R7 :0.1max
Visual inspection.
The capacitance/Q/D.F. should be measured at 25℃ at the
frequency and voltage shown in the table.
Char.
Item
Frequency
Voltage
Insulation
Resistance
25
℃
Insulation
Resistance
125℃
150℃
Dielectric
Strength
R7
6.3V max.
(C
≦
10F)
10.1kHz
0.50.1Vrms
R7
10V min.
(C
≦
10F)
10.1kHz
10.2Vrms
R7
(10F < C)
12024Hz
0.50.1Vrms
50Ω
・F
min.
The insulation resistance should be measured with a DC voltage not
exceeding the rated voltage at 25℃ and 125℃ within 1 minute of
charging.
5Ω
・F
min.
No failure
No failure should be observed when 250% of the rated voltage is
applied between the terminations for 1 to 5 seconds, provided the
charge/ discharge current is less than 50mA.
JEMCGS-0735G
4
■AEC-Q200
Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
Appearance
No marking defects
Specification.
AEC-Q200 Test Method
Solder the capacitor on the test jig (glass epoxy board) shown in
Fig1 using a eutectic solder. Then apply a force in the direction
shown in Fig 2 for 5±1sec. The soldering should be done by the
Capacitance
Change
Dissipation
Factor
R7: 0.1max
R7: Within ±10.0%
reflow method and should be conducted with care so that the
½ﾝﾃﾞﾝ½
soldering is uniform and free of defects such as heat shock.
18 Board Flex
Insulation
Resistance
50Ω
・F
min.
Type
GCM15
GCM18
45
GCM21
GCM31
GCM32
a
0.5
0.6
45
0.8
2.0
2.0
b
1.5
2.2
支持台
3.0
4.4
4.4
c
0.6
0.9
1.3
1.7
2.6
（in
mm）
*1,2：2.0±0.05
20
4.0±0.1
φ1.5
+0.1
-0
C
3.5± 0.05
Pressurizing
＊1
＊2
speed:1.0mm/s
Pressurize
40
c
1.75±0.1
8.0±0.3
b
114
Ａ
R4
Ｂ
a
100
0.05以下
Fig.1
t : 1.6mm
(GCM15:0.8mm)
Capacitance meter
Flexure：≦2
t
(High Dielectric Type)
45
45
Fig.2
19 Terminal
Strength
Capacitance
Change
Dissipation
Factor
Within specified tolerance
R7: 0.1max
Appearance
No marking defects
Solder the capacitor to the test jig (glass epoxy board) shown in
Fig.3 using a eutectic solder. Then apply *18N force in parallel with
the test jig for 60sec.
The soldering should be done either with an iron or using the reflow
method and should be conducted with care so that the soldering is
uniform and gree of defects such as heat shock
*2N(GCM15)
Insulation
Resistance
50Ω
・F
min.
Type
GCM15
GCM18
GCM21
GCM31
GCM32
a
0.4
1.0
1.2
2.2
2.2
b
1.5
3.0
4.0
5.0
5.0
c
0.5
1.2
1.65
2.0
2.9
c
（in
mm）
b
a
ﾗﾝﾄﾞ
b
f4.5
T:1.6mm
(GCM15:0.8mm)
Solder resist
Baked electrode or
Copper foil
c
a
20 Beam Load Test
Destruction value should be exceed following one.
< Chip L dimension : 2.5mm max. >
Chip thickness > 0.5mm rank : 20N
Chip thickness
≦0.5mm
rank : 8N
< Chip L dimension : 3.2mm max. >
Chip thickness < 1.25mm rank : 15N
Chip
thickness
≧1.25mm
rank : 54.5N
Fig.3
Place the capacitor in the beam load fixture as Fig 4.
Apply a force.
< Chip Length : 2.5mm max. >
Iron Board
< Chip Length : 3.2mm min. >
L
0.6L
Fig.4
Speed supplied the Stress Load : 0.5mm / sec.
JEMCGS-0735G
5
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