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2SA1020-Y(T6CN,A,F

Description
TRANS PNP 2A 50V TO226-3
Categorysemiconductor    Discrete semiconductor   
File Size168KB,5 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Environmental Compliance
Download Datasheet Parametric View All

2SA1020-Y(T6CN,A,F Overview

TRANS PNP 2A 50V TO226-3

2SA1020-Y(T6CN,A,F Parametric

Parameter NameAttribute value
Transistor typePNP
Current - Collector (Ic) (Maximum)2A
Voltage - collector-emitter breakdown (maximum)50V
Vce saturation value (maximum value) when different Ib,Ic500mV @ 50mA,1A
Current - collector cutoff (maximum)1µA(ICBO)
DC current gain (hFE) at different Ic, Vce (minimum value)70 @ 500mA,2V
Power - Max900mW
Frequency - Transition100MHz
Operating temperature150°C(TJ)
Installation typeThrough hole
Package/casingTO-226-3, TO-92-3 long body
Supplier device packagingTO-92MOD
2SA1020
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)
2SA1020
Power Amplifier Applications
Power Switching Applications
Low Collector saturation voltage: V
CE (sat)
=
−0.5
V (max) (I
C
=
−1
A)
High collector power dissipation: P
C
= 900 mW
High-speed switching: t
stg
= 1.0
μs
(typ.)
Complementary to 2SC2655
Unit: mm
Absolute Maximum Ratings
(T
a
=
25°C)
Characteristics
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Base current
Collector power dissipation
Junction temperature
Storage temperature range
Symbol
V
CBO
V
CEO
V
EBO
I
C
I
B
P
C
T
j
T
stg
Rating
−50
−50
−5
−2
−0.2
900
150
−55
to 150
Unit
V
V
V
A
A
mW
°C
°C
JEDEC
JEITA
TOSHIBA
TO-92MOD
2-5J1A
Weight: 0.36 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2010-11-09

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