SNJ54ABT8245JT datasheet, PDF - EEWORLD Datasheet

SNJ54ABT8245JT: DescriptionScan Test Devices With Octal Bus Transceivers 24-CDIP -55 to 125; Categorylogic logic; File Size1MB，31 Pages; ManufacturerTexas Instruments; Websitehttp://www.ti.com.cn/

Stay tuned Parametric Compare

SNJ54ABT8245JT Overview

Scan Test Devices With Octal Bus Transceivers 24-CDIP -55 to 125

Parameter Name	Attribute value
Brand Name	Texas Instruments
Maker	Texas Instruments
Parts packaging code	DIP
package instruction	DIP, DIP24,.3
Contacts	24
Reach Compliance Code	not_compliant
Factory Lead Time	6 weeks
Other features	WITH DIRECTION CONTROL
Control type	COMMON CONTROL
Counting direction	BIDIRECTIONAL
series	ABT
JESD-30 code	R-GDIP-T24
length	32 mm
Load capacitance (CL)	50 pF
Logic integrated circuit type	BOUNDARY SCAN BUS TRANSCEIVER
MaximumI(ol)	0.064 A
Number of digits	8
Number of functions	1
Number of ports	2
Number of terminals	24
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
Output characteristics	3-STATE
Output polarity	TRUE
Package body material	CERAMIC, GLASS-SEALED
encapsulated code	DIP
Encapsulate equivalent code	DIP24,.3
Package shape	RECTANGULAR
Package form	IN-LINE
method of packing	TUBE
Peak Reflow Temperature (Celsius)	NOT SPECIFIED
power supply	5 V
Maximum supply current (ICC)	38 mA
Prop。Delay @ Nom-Sup	5.8 ns
propagation delay (tpd)	5.5 ns
Certification status	Not Qualified
Filter level	MIL-PRF-38535
Maximum seat height	5.08 mm
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	NO
technology	BICMOS
Temperature level	MILITARY
Terminal form	THROUGH-HOLE
Terminal pitch	2.54 mm
Terminal location	DUAL
Maximum time at peak reflow temperature	NOT SPECIFIED
translate	N/A
width	6.92 mm
Base Number Matches	1

	SNJ54ABT8245JT	5962-9318601M3A	FP-8999LF-01-1043-DG	SNJ54ABT8245FK	SN74ABT8245	SN54ABT8245
Description	Scan Test Devices With Octal Bus Transceivers 24-CDIP -55 to 125	Scan Test Devices With Octal Bus Transceivers 28-LCCC -55 to 125	Array/Network Resistor, Isolated, Tantalum Nitride/nickel Chrome, 0.05W, 104000ohm, 50V, 0.5% +/-Tol, -100,100ppm/Cel, 3925,	Scan Test Devices With Octal Bus Transceivers 28-LCCC -55 to 125	SN74ABT8245 Scan Test Devices With Octal Bus Transceivers	SN54ABT8245 Scan Test Devices With Octal Bus Transceivers
Reach Compliance Code	not_compliant	not_compliant	compliant	not_compliant	-	-
series	ABT	ABT	FP	ABT	-	-
Number of terminals	24	28	16	28	-	-
Maximum operating temperature	125 °C	125 °C	125 °C	125 °C	-	-
Minimum operating temperature	-55 °C	-55 °C	-65 °C	-55 °C	-	-
Package form	IN-LINE	CHIP CARRIER	SMT	CHIP CARRIER	-	-
technology	BICMOS	BICMOS	TANTALUM NITRIDE/NICKEL CHROME	BICMOS	-	-

Shortcut: E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 EA EB EC ED EE EF EG EH EI EJ EK EL EM EN EO EP EQ ER ES ET EU EV EW EX EY EZ F0 F1 F2 F3 F4 F5 F6 F7 F8 F9 FA FB FC FD FE FF FG FH FI FJ FK FL FM FN FO FP FQ FR FS FT FU FV FW FX FY FZ G0 G1 G2 G3 G4 G5 G6 G7 G8 G9 GA GB GC GD GE GF GG GH GI GJ GK GL GM GN GO GP GQ GR GS GT GU GV GW GX GZ H0 H1 H2 H3 H4 H5 H6 H7 H8 HA HB HC HD HE HF HG HH HI HJ HK HL HM HN HO HP HQ HR HS HT HU HV HW HX HY HZ I1 I2 I3 I4 I5 I6 I7 IA IB IC ID IE IF IG IH II IK IL IM IN IO IP IQ IR IS IT IU IV IW IX J0 J1 J2 J6 J7 JA JB JC JD JE JF JG JH JJ JK JL JM JN JP JQ JR JS JT JV JW JX JZ K0 K1 K2 K3 K4 K5 K6 K7 K8 K9 KA KB KC KD KE KF KG KH KI KJ KK KL KM KN KO KP KQ KR KS KT KU KV KW KX KY KZ

Popular Components