CR1812JR025E04Z datasheet, PDF

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CR1812JR025E04Z: DescriptionPower: 1/2W Accuracy: ±5% Resistance (ohms): 0.025 Temperature coefficient: -; CategoryPassive components Patch low resistance of sampling resistor; File Size1MB，11 Pages; ManufacturerEVER OHMS TECHNOLOGY CO.,LTD.; Websitehttp://www.everohms.com/; Tianer Technology was established in 1988 and has the R&D capabilities and manufacturing technology for chip resistors and arrays. In the face of today's diverse customer needs, we continue to invest in the development of high-quality products and new manufacturing technologies, and provide customers with a one-time purchase service for multiple components to fully meet customer needs and improve customer satisfaction with our products. In terms of quality management, our company has passed ISO-9001, ISO-TS16949, TTQS certification and complies with the AEC-Q200 automotive electronics self-testing standard. We continuously improve the quality of our products and services through the analysis and improvement of product yield rate indicators, customer satisfaction surveys and other reports, in order to enhance customer trust in our company and establish a good partnership with our customers.

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CR1812JR025E04Z Overview

Power: 1/2W Accuracy: ±5% Resistance (ohms): 0.025 Temperature coefficient: -

CR1812JR025E04Z Parametric

Parameter Name	Attribute value
power	1/2W
Accuracy	±5%
Resistance (ohms)	0.025
Temperature Coefficient	-

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Thick Film Chip Resistor — CR Series

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Application

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Entertainment: Stereo, TV tuners, Tape recorder

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Appliance: Air conditioner, Refrigerator

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Computer & relative products: Main board, PDA

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Communication equipment: Cell phone, Fax machine

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Power equipment: Power supply, Illumination equipment

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Measuring instrument: Electric meter, Navigation equipment

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Features

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Small size and light weight

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Reduction of assembly costs and matching with placement machines

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Reliability, high quality and fast delivery

TEL: 886-7-8116611

FAX: 886-7-8115533

E-mail:

service@everohms.com

http://www.everohms.com

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