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BAV199DW

Description
Diode
CategoryDiscrete semiconductor    diode   
File Size84KB,2 Pages
ManufacturerJCET
Websitehttp://www.cj-elec.com/

Jiangsu Changdian Technology Co., Ltd. focuses on semiconductor packaging and testing business, providing customers at home and abroad with a full range of solutions such as chip testing, packaging design, packaging testing, etc. The company was successfully listed on the Shanghai Main Board in 2003, becoming the first semiconductor packaging and testing listed company in China. It now has a national enterprise technology center and a postdoctoral research workstation. It is a national key high-tech enterprise, a supporting unit of the National Engineering Laboratory for High-density Integrated Circuits, and the chairman unit of the Integrated Circuit Packaging Technology Innovation Strategic Alliance.

Discrete devices: diodes (switching diodes, Schottky diodes (Schottky rectifiers), voltage regulator diodes, Pin diodes, TVS diodes, rectifier diodes, fast recovery diodes); transistors (Darlington tubes, digital transistors, MOSFETs); thyristors: silicon-controlled rectifiers, triacs; composite tubes: transistors + field-effect tubes, dual transistors, dual digital transistors, digital transistors + transistors, transistors + diodes, field-effect tubes + diodes, dual field-effect tubes. Voltage regulator circuit; energy-saving lamp charger switch tube

Lead frame: TO series (TO); SOD series (SOD); SOT series (TSOT, SOT); FBP series (WBFBP); QFN series (QFNWB, DFNWB, DFNFC, QFNFC); ​​QFP series (LQFP: PQFP: PLCC: TQFP); SIP series (SIP, HSIP, FSIP); SOP series (SOP, HSOP, SSOP, MSOP, HTSOP, TSSOP); DIP series (DIP, FDIP, SDIP); PDFN series; PQFN series; MIS series (MISFC, MISWB)

Nine core technologies: Through Silicon Via (TSV) packaging technology; SiP RF packaging technology; wafer-level 3D rewiring packaging process technology; copper bump interconnection technology; high-density FC-BGA packaging and testing technology (Flip Chip BGA); multi-turn array four-sided pinless packaging and testing technology; package body 3D stacking technology; 50μm or less ultra-thin chip 3D stacking packaging technology; MEMS multi-chip packaging technology; MIS packaging technology (pre-encapsulated interconnection system); BGA packaging technology, etc.

 

 

Download Datasheet Parametric View All

BAV199DW Overview

Diode

BAV199DW Parametric

Parameter NameAttribute value
MakerJCET
Reach Compliance Codeunknown
Maximum forward voltage (VF)0.9 V
Maximum operating temperature150 °C
Minimum operating temperature-55 °C
Maximum power dissipation0.2 W
Maximum repetitive peak reverse voltage85 V
Maximum reverse current0.005 µA
Maximum reverse recovery time0.003 µs
Reverse test voltage75 V
surface mountYES

BAV199DW Preview

JIANGSU CHANGJIANG ELECTRONICS TECHNOLOGY CO., LTD
SOT-363 Plastic-Encapsulate Diodes
BAV199DW
FEATURES
Power dissipation
P
CM:
0.2
W (Tamb=25℃)
Multi-Chip DIODES
SOT-363
Collector current
I
F
:
200
mA
Collector-base voltage
V
R
:
85
V
Operating and storage junction temperature range
T
J
,T
stg
: -55℃ to +150℃
MARKING:K52
ELECTRICAL CHARACTERISTICS (Tamb=25℃
Parameter
Reverse breakdown voltage
Reverse voltage leakage current
Symbol
V
(BR) R
I
R
unless
otherwise
specified)
MIN
85
5
0.9
1.0
1.1
1.25
TYP
MAX
UNIT
V
nA
Test
conditions
I
R
= 100µA
V
R
=75V
I
F
=1mA
I
F
=10mA
I
F
=50mA
I
F
=150mA
V
R
=0V
f=1MHz
Forward voltage
V
F
V
Junction capacitance
C
j
2
pF
I
F
=I
R
=10mA
Reveres recovery time
t
rr
I
rr
=0.1ХI
R
R
L
=100Ω
3
nS
Typical Characteristics
BAV199DW
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