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What does the EAS test of the chip mean and what is its function? Please give me some advice [Copy link]

As the title says, thank you

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EAS avalanche testing can eliminate product failures caused by wafer defects and damage caused by the packaging process. It is a conventional testing method and can improve product reliability. Wafer defects and packaging damage can be controlled through some measures during the manufacturing process, thereby reducing the possibility of product failure.   Details Published on 2020-12-8 21:06

1w

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What is the source? In what document?

This post is from Analog electronics
 
Personal signature上传了一些书籍资料,也许有你想要的:https://download.eeworld.com.cn/user/chunyang
 

2w

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It should be the avalanche test of the power tube

Avalanche energy test is called ESA, and avalanche current test is called IAR

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2w

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The chip EAS test mentioned by the OP,

For example, for MOS tubes, the quality of EAS characteristics will directly affect the safe operating area and life of the device. For power MOS, EAS characteristics are considered to be an important indicator of device safety.

This post is from Analog electronics
 
 
 
 

2w

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EAS avalanche testing can eliminate product failures caused by wafer defects and damage caused by the packaging process. It is a conventional testing method and can improve product reliability. Wafer defects and packaging damage can be controlled through some measures during the manufacturing process, thereby reducing the possibility of product failure.

This post is from Analog electronics
 
 
 
 

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