• You can log in to your eeworld account to continue watching:
  • Overview
  • Login
  • Duration:16 minutes and 52 seconds
  • Date:2019/04/20
  • Uploader:JFET
Introduction
Through this course, you will learn about the basic concepts of sensors and their basic characteristics (static and dynamic characteristics), the working principles, structural composition, characteristic analysis, signal conditioning circuits of typical sensors, and the testing methods of typical parameters (vibration, temperature, flow), System composition; understand the application of sensors and testing technology in the national economy and the latest development trends; improve learners' ability to creatively use knowledge and independently discover, research and solve problems.
We divide the sensor and testing technology course into four parts (basic theory of sensor and testing technology, sensor principle, typical parameter measurement, precision measuring instruments), sixteen chapters, and a total of 26 lectures. The main contents include: basic concepts of sensors and testing technology, systematic characteristic analysis of testing, strain gauge sensors, capacitive sensors, inductive sensors, piezoelectric sensors, Hall sensors, CCD image sensors, optical fiber sensors, and induction synchronization instrument, measurement grating and other grating sensors, other sensors, vibration measurement, temperature measurement, flow measurement, three coordinate measuring machine.
Unfold ↓

You Might Like

Recommended Posts

Small base stations, a powerful tool to solve the pain points of 5G networks
Small base stations are much smaller than traditional macro base stations in terms of product form, transmission power, and coverage. They are used to cover traffic hotspots. In the construction of 5G
兰博 RF/Wirelessly
How to automate the test of electromagnetic relays? (Experience sharing - Part 1)
This content is originally created by EEWORLD forum user Zhao Jun 2019. If you want to reprint or use it for commercial purposes, you must obtain the author's consent and indicate the source Electroma
赵君2019 Talking
MSP430F5529 Unified Clock System UCS
First of all, let me add: there is another module clock source: MODOSC, which generates the MODCLK clock source signal and generally only serves the flash memory control module and ADC12 module. This
火辣西米秀 Microcontroller MCU
3020 laser engraving machine modification size
I am a novice, I have a laser engraving machine, the engraving size is 3020, but I think the work surface is too small, can I remove all the motherboard in the machine, and then change to a larger 609
有翅膀、无天堂 DIY/Open Source Hardware
EEWORLD University Hall - Application strategies for measurement and control questions in electronic design competitions
Application strategies for measurement and control questions in electronic design competitions : https://training.eeworld.com.cn/course/5829Teacher Tang talks about the application strategies of measu
JFET Test/Measurement

Recommended Content

Hot VideosMore

可能感兴趣器件

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

About Us Customer Service Contact Information Datasheet Sitemap LatestNews


Room 1530, 15th Floor, Building B, No.18 Zhongguancun Street, Haidian District, Beijing, Postal Code: 100190 China Telephone: 008610 8235 0740

Copyright © 2005-2024 EEWORLD.com.cn, Inc. All rights reserved 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号